Broadband Measurement of Substrate Complex Permittivity Using Optimized ABCD Matrix
Broadband Measurement of Substrate Complex Permittivity Using Optimized ABCD Matrix
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使用优化 ABCD 矩阵宽带测量基底复介电常数
DOI：
10.1109/access.2020.3044699
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发表时间：
2020
期刊：
影响因子：
3.9
通讯作者：
Hong Wei
中科院分区：
文献类型：
--
作者：
Cai Longzhu;Jiang Zhi Hao;Hong Wei
本文提出了一种基于优化ABCD矩阵的双传输在线方法，用于宽带和连续衬底介质的表征。首先对原始的单线算法进行了讨论和仿真，但测量结果表明，由于存在微波连接器和过渡不匹配，提取的参数与实际值相差较大。因此，本文提出了一种基于优化ABCD矩阵的改进双线算法，用于非接地共面波导（UGCPW）结构，该算法非常适用于在新开发的衬底上具有一致导体层的电镀电路。一个全面的程序来计算总线路衰减，相数，特性阻抗，衬底介电常数，和介电损耗正切描述。由于考虑了导体和辐射损耗，提取的结果与参考值的一致性在个位数百分比内。本文还对测量不确定度进行了分析，并给出了相应的不确定度预算。所提出的方法有望应用于任何具有任意特性阻抗的传输线，而不需要事先知道衬底介电常数，并且除了矢量网络分析仪（VNA）的校准套件外，不需要额外的校准。
In this paper, a novel two-transmission-line method based on optimized ABCD matrix for broadband and continuous substrate dielectric characterization is presented. The original single-line algorithm is firstly discussed and simulated, while the measurement shows that the extracted parameters are far from the actual values due to the presence of microwave connectors and transition mismatches. Therefore, a modified two-line algorithm based on the optimized ABCD matrix is proposed for ungrounded coplanar waveguide (UGCPW) configuration, which is very suitable for electroplating circuits with a consistent conductor layer on newly developed substrates. A comprehensive procedure to calculate the total line attenuation, phase number, characteristic impedance, substrate dielectric constant, and dielectric loss tangent is described. Since both conductor and radiation losses are taken into account, the extracted results show consistency within a single-digital percentage with the reference values. The analysis of the measurement uncertainty and the related uncertainty budgets for the derived dielectric results are also presented. The proposed method is expected to be applied to any transmission lines with arbitrary characteristic impedance, without a prior knowledge of substrate dielectric constant, and no additional calibrations are required other than the calibration kit for Vector Network Analyzer (VNA).
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DOI：
10.1002/0471221619
发表时间：
2001
期刊：
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影响因子：
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作者：
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通讯作者：
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DOI：
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发表时间：
2017-01
影响因子：
4.3
作者：
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作者：
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影响因子：
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作者：
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DOI：
10.1109/arftg79.2012.6291183
发表时间：
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期刊：
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影响因子：
--
作者：
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