Electron tomography of regularly shaped nanostructures under non‐linear image acquisition
Electron tomography of regularly shaped nanostructures under non‐linear image acquisition
复制标题
非线性图像采集下规则形状纳米结构的电子断层扫描
作者：
Z. Saghi;X. Xu;G. Möbus
电子断层扫描允许纳米结构的3D定量表征，只要投影信号与样品的原子序数和厚度之间满足单调关系。如果显微照片受到（i）衍射对比度、（ii）检测器饱和度或（iii）高厚度下吸收（高角度散射）导致的对比度反转的影响，则不满足此要求。使用计算机模拟和钨尖端和CeO2纳米颗粒的实验倾斜系列检查与非单调断层扫描采集相关的伪影。导出了条件，在该条件下，尽管存在非线性伪影，但信息足以通过几何层析成像重建凸对象的3D形态。
Electron tomography allows the 3D quantitative characterization of nanostructures, provided a monotonic relationship is fulfilled between the projected signal and the atomic number and thickness of the specimen. This requirement is not satisfied if the micrographs are affected by (i) diffraction contrast, (ii) detector saturation or (iii) contrast inversion due to absorption (high‐angle scattering) at high thickness. Artefacts related to the non‐monotonic tomography acquisition are examined using computer simulations and experimental tilt series of tungsten tips and CeO2 nanoparticles. Conditions are derived under which in spite of the non‐linear artefacts the information is sufficient for reconstructing the 3D morphology of convex objects by geometric tomography.
影响因子：
3
作者：
Frank, J;Wagenknecht, T;Mannella, CA
通讯作者：
Mannella, CA