Geometric Characterization of Carbon Nanotubes by Atomic Force Microscopy in Conjunction with a Tip Characterizer
Geometric Characterization of Carbon Nanotubes by Atomic Force Microscopy in Conjunction with a Tip Characterizer
复制标题
通过原子力显微镜结合尖端表征仪对碳纳米管进行几何表征
DOI：
10.1143/jjap.47.6128
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发表时间：
2008-07
影响因子：
1.5
通讯作者：
中科院分区：
文献类型：
--
作者：
An atomic force microscopy (AFM) probe tip characterizer with 14 line and space structures and two knife edges was fabricated by means of a superlattice technique. The shape of a probe tip both before and after AFM imaging was acquired by this tip characterizer with general variations <1.5 nm; depending on imaging conditions. The geometric structures of carbon nanotubes (CNTs) on a SiO2 substrate were studied by dynamic mode AFM in conjunction with this tip characterizer. Contact points between the tip and the CNTs were detected by observing changes in the AFM phase images. A modified CNT width correction model was established to calculate the estimated and upper-limit widths of two CNTs. The experimental results showed that imaging under a weak attractive force was suitable for obtaining accurate CNT height measurements, whereas a weak repulsive force provided the most accurate widths. Differing heights and widths between the two CNTs suggested that one CNT was double-walled, whereas the other had more than two walls; these results agree with transmission electron microscopy (TEM) measurements of the CNTs.
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影响因子：
3.5
作者：
Strus, MC;Raman, A;Nguyen, CV
通讯作者：
Nguyen, CV
影响因子：
3.3
作者：
I. Shapiro;S. Solares;M. Esplandiu;L. Wade;W. Goddard;C. Collier
通讯作者：
I. Shapiro;S. Solares;M. Esplandiu;L. Wade;W. Goddard;C. Collier
影响因子：
1.6
作者：
Itoh, Hiroshi;Fujimoto, Toshiyuki;Ichimura, Shingo
通讯作者：
Ichimura, Shingo
影响因子：
3.7
作者：
García, R;San Paulo, A
通讯作者：
San Paulo, A
DOI：
10.6028/jres.102.030
发表时间：
1997-07
影响因子：
1.5
作者：
Villarrubia JS
通讯作者：
Villarrubia JS