Simulation-guided nanofabrication of high-quality practical tungsten probes.
Simulation-guided nanofabrication of high-quality practical tungsten probes.
复制标题
模拟引导的高质量实用钨探针纳米制造
作者:
Micro/nanoscale tungsten probes are widely utilized in the fields of surface analysis, biological engineering, etc. amongst several others. This work performs comprehensive dynamic simulations on the influences of electric field distribution, surface tension and the bubbling situation on electrochemical etching behaviors, and then the tip dimension. Results show that the etching rate is reliant on the electric field distribution determined by the cathode dimension. The necking position lies in the meniscus rather than at the bottom of the meniscus. A bubble-free condition is mandatory to stabilize the distribution of OH− and WO42− ions for a smooth tungsten probe surface. Such simulation-guidance enables the nanofabrication of probes with a high aspect ratio (10 : 1), ultra-sharp tip apex (40 nm) and ultra-smooth surface. These probes have been successfully developed for high-performance application with Scanning Tunneling Microscopy (STM). The acquired decent atomic resolution images of epitaxial bilayer graphene robustly verify the feasibility of the practical level application of these nanoscale probes. Therefore, these nanoscale probes would be of great benefit to the development of advanced analytical science and nano-to-atomic scale experimental science and technology.
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影响因子:
16.6
作者:
Li S;Jones RR
通讯作者:
Jones RR
影响因子:
8.6
作者:
Levy, Amir;Andelman, David;Orland, Henri
通讯作者:
Orland, Henri
影响因子:
4.6
作者:
Ju, Bing-Feng;Chen, Yuan-Liu;Yang, Yunhai
通讯作者:
Yang, Yunhai
影响因子:
7.2
作者:
Gilliam, R. J.;Graydon, J. W.;Thorpe, S. J.
通讯作者:
Thorpe, S. J.
影响因子:
41.2
作者:
Comtet J;Niguès A;Kaiser V;Coasne B;Bocquet L;Siria A
通讯作者:
Siria A