A comprehensive formal security analysis and revision of the two-phase key exchange primitive of TPM 2.0
A comprehensive formal security analysis and revision of the two-phase key exchange primitive of TPM 2.0
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TPM 2.0 两阶段密钥交换原语的全面形式安全分析和修订
DOI:
10.1016/j.comnet.2020.107369
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发表时间:
2019-06
影响因子:
5.6
通讯作者:
Shijun Zhao
中科院分区:
文献类型:
--
作者:
Qianying Zhang;Shijun Zhao
The Trusted Platform Module (TPM) version 2.0 provides a two-phase key exchange primitive which can be used to implement three widely-standardized authenticated key exchange protocols: the Full Unified Model, the Full MQV, and the SM2 key exchange protocols. However, vulnerabilities have been found in all of these protocols. Fortunately, it seems that the protections offered by TPM chips can mitigate these vulnerabilities. In this paper, we present a security model which captures TPM’s protections on keys and protocols’ computation environments and in which multiple protocols can be analyzed in a unified way. Based on the unified security model, we give the first formal security analysis of the key exchange primitive of TPM 2.0, and the analysis results show that, with the help of hardware protections of TPM chips, the key exchange primitive indeed satisfies the well-defined security property of our security model, but unfortunately under some impractical limiting conditions, which would prevent the application of the key exchange primitive in real-world networks. To make TPM 2.0 applicable to real-world networks, we present a revision of the key exchange primitive of TPM 2.0, which can be secure without the limiting conditions. We give a rigorous analysis of our revision, and the results show that our revision achieves not only the basic security property of modern AKE security models but also some further security properties.
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DOI:
10.1007/978-3-319-22846-4_3
发表时间:
2015-08
期刊:
IACR Cryptol. ePrint Arch.
影响因子:
--
作者:
Shijun Zhao;Qianying Zhang
通讯作者:
Shijun Zhao;Qianying Zhang
DOI:
--
发表时间:
1986-02
期刊:
Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E
影响因子:
--
作者:
Tsutomu Matsumoto;Y. Takashima;H. Imai
通讯作者:
Tsutomu Matsumoto;Y. Takashima;H. Imai
DOI:
10.1007/978-3-540-76900-2_29
发表时间:
2007-12
期刊:
--
影响因子:
--
作者:
T. Okamoto
通讯作者:
T. Okamoto
DOI:
10.1109/euc.2010.98
发表时间:
2010-12
期刊:
2010 IEEE/IFIP International Conference on Embedded and Ubiquitous Computing
影响因子:
--
作者:
Liqun Chen;B. Warinschi
通讯作者:
Liqun Chen;B. Warinschi
DOI:
10.1007/978-3-319-17533-1_11
发表时间:
2015-05
期刊:
IACR Cryptol. ePrint Arch.
影响因子:
--
作者:
Shijun Zhao;Qianying Zhang
通讯作者:
Shijun Zhao;Qianying Zhang