Uncertainty-wise test case generation and minimization for Cyber-Physical Systems
Uncertainty-wise test case generation and minimization for Cyber-Physical Systems
复制标题
网络物理系统的不确定性测试用例生成和最小化
DOI:
10.1016/j.jss.2019.03.011
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发表时间:
2019-07
影响因子:
3.5
通讯作者:
Tao Yue
中科院分区:
文献类型:
--
作者:
Man Zhang;Shaukat Ali;Tao Yue
Cyber-Physical Systems (CPSs) typically operate in highly indeterminate environmental conditions, which require the development of testing methods that must explicitly consider uncertainty in test design, test generation, and test optimization. Towards this direction, we propose a set of uncertainty-wise test case generation and test case minimization strategies that rely on test ready models explicitly specifying subjective uncertainty. We propose two test case generation strategies and four test case minimization strategies based on the Uncertainty Theory and multi-objective search. These strategies include a novel methodology for designing and introducing indeterminacy sources in the environment during test execution and a novel set of uncertainty-wise test verdicts. We performed an extensive empirical study to select the best algorithm out of eight commonly used multi-objective search algorithms, for each of the four minimization strategies, with five use cases of two industrial CPS case studies. The minimized set of test cases obtained with the best algorithm for each minimization strategy were executed on the two real CPSs. The results showed that our best test strategy managed to observe 51% more uncertainties due to unknown indeterminate behaviors of the physical environments of the CPSs as compared to the other test strategies. Also, the same test strategy managed to observe 118% more unknown uncertainties as compared to the unique number of known uncertainties.
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影响因子:
7
作者:
Antonio J. Nebro;J. Durillo;F. Luna;B. Dorronsoro;E. Alba
通讯作者:
Antonio J. Nebro;J. Durillo;F. Luna;B. Dorronsoro;E. Alba
影响因子:
--
作者:
ZADEH, LA
通讯作者:
ZADEH, LA
DOI:
10.4324/9781849773607
发表时间:
2008
期刊:
--
影响因子:
--
作者:
M. Smithson;R. Attewell;Stephen Buckman;Ann Curthoys;Kate Delaney;Stephen Dovers;Liz. Furler;Alexander Grishin;J. Handmer;Steve Longford;John Mackey;Judith S Jones;Michael Moore;Michael McFadden;Paul Perkins;Pascal Perez;Stephen Pickard;A. Plant;J. Quiggin;Alison Ritter;Ian White;G. Bammer
通讯作者:
M. Smithson;R. Attewell;Stephen Buckman;Ann Curthoys;Kate Delaney;Stephen Dovers;Liz. Furler;Alexander Grishin;J. Handmer;Steve Longford;John Mackey;Judith S Jones;Michael Moore;Michael McFadden;Paul Perkins;Pascal Perez;Stephen Pickard;A. Plant;J. Quiggin;Alison Ritter;Ian White;G. Bammer
DOI:
10.1109/icse.2004.1317431
发表时间:
2004-05
期刊:
Proceedings. 26th International Conference on Software Engineering
影响因子:
--
作者:
L. Briand;Y. Labiche;Yihong Wang
通讯作者:
L. Briand;Y. Labiche;Yihong Wang
DOI:
10.1109/icst.2008.7
发表时间:
2008-04
期刊:
2008 1st International Conference on Software Testing, Verification, and Validation
影响因子:
--
作者:
V. Garousi
通讯作者:
V. Garousi