Modification of the Extended Advanced IEM for Scattering From Randomly Rough Surfaces

Modification of the Extended Advanced IEM for Scattering From Randomly Rough Surfaces
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针对随机粗糙表面散射的扩展高级 IEM 的修改

DOI:
10.1109/lgrs.2020.2971532
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发表时间:
2021-02
影响因子:
4.8
通讯作者:
Yang Du
Yang Du
中科院分区:
工程技术2区
文献类型:
--
作者:
Jingsong Yang;Yongxing Li;J. C. Shi;Yang Du

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在这封信中,我们修改了扩展的先进积分方程模型(EAIEM)的电磁后向散射和双站散射从小到中等高度的粗糙表面。我们将EAIEM模型中引入的误差函数的一阶近似扩展到二阶,希望更适合于大粗糙度和高频率。此外,提出了一种新的过渡模型的反射系数的平均表面曲率,频率和介电常数的依赖性明确,而不使用的补充项,这一项的不充分的评价的影响被减轻。与POLARSCAT数据的后向散射和欧洲微波特征实验室(EMSL)的双站散射测量的比较表明,更新后的模型的有效性。
In this letter, we modify the extended advanced integral equation model (EAIEM) for electromagnetic backscattering and bistatic scattering from rough surfaces with small to moderate heights. We extend the first-order approximation of the error function as introduced in the EAIEM model to the second order, in a hope to be more suitable for large roughness and high frequency. In addition, a new transition model for the reflection coefficient is proposed to make the dependences explicit on the mean surface curvature, frequency, and dielectric constant, whereas making no use of the complementary term, the effect of inadequate evaluation of this term is mitigated. Comparison with POLARSCAT data for backscattering and with European Microwave Signature Laboratory (EMSL) measurements for bistatic scattering demonstrates the validity of the updated model.
DOI: 10.1109/igarss.1996.516906
发表时间: 1996-05
期刊: IGARSS '96. 1996 International Geoscience and Remote Sensing Symposium
影响因子: --
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