Engineering Research Equipment Grant: (VLSI Testing Equipments)

工程研究设备补助金：（VLSI测试设备）

• 批准号: 8506321
• 负责人: Irving Reed
• 金额: $ 6万
• 依托单位: University of Southern California
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1985
• 资助国家: 美国
• 起止时间: 1985-07-15 至 1986-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8506321&HistoricalAwards=false
• 关键词: Engineering; Research; Equipment; Grant; VLSI

Equipment is obtained that is required to perform testing on VLSI chips and this equipment consists of two parts. The first part is a logic analysis system which includes a logic analyzer and a pattern generator. The pattern generator generates a sequence of test vectors which are then fed into the unit under test. The outputs of the logic analyzer are used to detect errors in the chip (only at the logic level). The second part of testing is at the physical level which requires a probing station system. This system has probes which can access almost every part of the chip. Signals are fed in and out of the chip and a particular part of the chip can be isolated. The Hewlett Packard 163OG is the logic analyzer to be used and the 600-MZ analytical test station from micro-tec West, Inc., forms that major portion of the probing system. The VLSI testing station will be used to check chips for communication and signal processing systems, in particular, a concatenated coding system.

获得对VLSI芯片进行测试所需的设备，该设备由两部分组成。 第一部分是逻辑分析系统，包括逻辑分析仪和模式生成器。 模式生成器生成一系列测试向量，然后将其馈送到被测单元中。 逻辑分析仪的输出用于检测芯片中的错误（仅在逻辑级）。 测试的第二部分是物理层面，需要探测站系统。 该系统的探针几乎可以访问芯片的每个部分。 信号从芯片馈入和馈出，并且可以隔离芯片的特定部分。 Hewlett Packard 163OG 是要使用的逻辑分析仪，而 micro-tec West, Inc. 的 600-MZ 分析测试站构成了探测系统的主要部分。 VLSI测试站将用于检查通信和信号处理系统的芯片，特别是级联编码系统。