Acquisition of Microscopes for the Facility for High Resolution Electron Microscopy (HREM)

为高分辨率电子显微镜 (HREM) 设施购置显微镜

基本信息

  • 批准号:
    8700535
  • 负责人:
  • 金额:
    $ 29万
  • 依托单位:
  • 依托单位国家:
    美国
  • 项目类别:
    Continuing Grant
  • 财政年份:
    1988
  • 资助国家:
    美国
  • 起止时间:
    1988-02-01 至 1989-07-31
  • 项目状态:
    已结题

项目摘要

The program of the ASU Facility for High Resolution Electron Microscopy, within the Center for Solid State Science, maintains a balance between the two main functions of the Facility operation. The program of developmental research, on the one hand, involves the exploration of new possibilities for instrumentation and operational techniques, and for these purposes new types of microscopes are being built, tested and further evaluated. On the other hand the Facility provides a service for many user groups, to make the most advanced current techniques and operational modes accessible for their research and to establish and maintain the highest standards of performance and interpretation in high resolution electron microscopy and associated techniques. The electron microscopes currently used in the Facility for this latter purpose are now out-dated, overworked and inadequate in relation to the quality and quality of the work demanded of them. A new microscope which is more appropriate for the purpose will be acquired. The new microscope is essential also in relation to the educational role of the Facility. Through its annual Schools and Workshops and continuing interactions with the scientific community the Facility has considerable impact on the standards of electron microscopy practice and must maintain its instrumentation at, or beyond, the state of the art in order to perform this function adequately.
ASU高分辨电子束装置程序 固态科学中心的显微镜, 基金两大职能之间的平衡 操作 发展研究计划,在一个 一方面,涉及探索新的可能性, 仪器和操作技术,并为这些 目的新型显微镜正在建造,测试和 进一步评价。 另一方面,该基金提供了一个 为众多用户群体提供服务,打造最先进的当前 可供研究的技术和操作模式 并建立和保持最高标准, 高分辨电子显微镜的性能和解释 显微镜和相关技术。 电子显微镜 目前用于后一目的的设施, 与质量有关的过时、过度和不足 和工作质量的要求。 一种新的显微镜, 更适合收购的目的。 新 显微镜在教育方面也是必不可少的 的设施。 通过其年度学校和讲习班, 继续与科学界互动, 设备对电子标准有相当大的影响 显微镜实践,必须保持其仪器,或 为了执行该功能, 充分。

项目成果

期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)

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John Cowley其他文献

John Cowley的其他文献

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{{ truncateString('John Cowley', 18)}}的其他基金

Subnanometer Crystalline Regions using Coherent Electron Microdiffraction
使用相干电子微衍射研究亚纳米晶体区域
  • 批准号:
    9014975
  • 财政年份:
    1991
  • 资助金额:
    $ 29万
  • 项目类别:
    Continuing Grant
Electron Diffraction and Imaging of Crystal Defects and Surfaces
晶体缺陷和表面的电子衍射和成像
  • 批准号:
    9110386
  • 财政年份:
    1991
  • 资助金额:
    $ 29万
  • 项目类别:
    Continuing Grant
Electron Optical Studies of Crystal Disorders, Defects and Surfaces
晶体无序、缺陷和表面的电子光学研究
  • 批准号:
    8810238
  • 财政年份:
    1988
  • 资助金额:
    $ 29万
  • 项目类别:
    Continuing Grant
The Center for High Resolution Electron Microscopy
高分辨率电子显微镜中心
  • 批准号:
    8611609
  • 财政年份:
    1987
  • 资助金额:
    $ 29万
  • 项目类别:
    Continuing Grant
INDUSTRY/UNIVERSITY COOPERATIVE RESEARCH: Studies of Subnanometer Crystalline Regions Using Coherent Electron Microdiffraction
产学合作研究:利用相干电子微衍射研究亚纳米晶体区域
  • 批准号:
    8618282
  • 财政年份:
    1987
  • 资助金额:
    $ 29万
  • 项目类别:
    Continuing Grant
Development of a Surface Research Electron Microscope (Materials Research)
表面研究电子显微镜的开发(材料研究)
  • 批准号:
    8500659
  • 财政年份:
    1986
  • 资助金额:
    $ 29万
  • 项目类别:
    Standard Grant
Disorder and Defects of Crystals Studied by Electron Microscopy (STEM and TEM) (Materials Research)
通过电子显微镜(STEM 和 TEM)研究晶体的无序和缺陷(材料研究)
  • 批准号:
    8510059
  • 财政年份:
    1985
  • 资助金额:
    $ 29万
  • 项目类别:
    Continuing Grant
Acquisition and Development of Electron Microscopes (Materials Research)
电子显微镜的购置和开发(材料研究)
  • 批准号:
    8308071
  • 财政年份:
    1984
  • 资助金额:
    $ 29万
  • 项目类别:
    Continuing Grant
The Center For High Resolution Electron Microscopy (Materials Research)
高分辨率电子显微镜中心(材料研究)
  • 批准号:
    8306501
  • 财政年份:
    1983
  • 资助金额:
    $ 29万
  • 项目类别:
    Continuing Grant
Surface Studies By Reflection and Transmission Electron Microscopy
通过反射和透射电子显微镜进行表面研究
  • 批准号:
    8114364
  • 财政年份:
    1982
  • 资助金额:
    $ 29万
  • 项目类别:
    Standard Grant

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