Engineering Research Equipment Grant: Ion-Milling Machine & Accessories

离子研磨机及其附件和辅助设备将 用于制备薄箔样品，适用于 透射电子显微镜（TEM）检查，如 沉淀强化ZnS、各种难熔金属硅化物和 含有微孔的玻璃质材料，以及质子 辐照的金属间化合物的横截面进行检查。 的 建议的设备也将使常规检查的 变形陶瓷材料、金属和陶瓷基体的微观结构 复合材料和金属合金，有时无意中涂层 在常规电抛光之后具有氧化物层。 更奇特 电子器件材料的横截面TEM样品制备 通过MBE制备，和氧化物衬底上的小金属簇， 预计将成为一种可能，因为 收购拟议中的设备。

The ion-milling machine, with accessories and ancillary apparatus will be used for the preparation of thin foil specimens suitable for examination by transmission electron microscopy (TEM), such as precipitation strengthened ZnS, various refractory metal silicides and glassy materials containing microscopic pores, as well as proton irradiated intermetallic compounds to be examined in cross-section. The proposed apparatus will also enable the routine examination of the microstructures of deformed ceramic materials, metal and ceramic matrix composites and metallic alloys that are sometimes inadvertently coated with an oxide layer after conventional electropolishing. More exotic cross-sectional TEM specimen preparation of electronic device materials prepared by MBE, and oxide substrates on which small metal clusters have been deposited, is expected to become a possibility as a consequence of the acquisition of the proposed apparatus.