ROW/EUA: AC Impedance Spectroscopy Study of ZnO/ZrO2 Single Crystal Junctions

本项目的目的是利用交流阻抗谱技术研究在钇稳定的Zr02上外延生长的Zn0单晶结的电学性质。在交流阻抗谱中，样品的阻抗是作为频率Z(w)的函数来测量的，并且使用复平面技术开发了样品的等效电路表示。等效电路中的每个元件代表样品的某些物理参数。研究这些组分如何随实验条件的变化而变化，可以深入了解控制电荷输运的物理过程。研究Zn0/Zr02单晶界面的一系列实验是：1)在惰性气体气氛中监测Z（w)作为温度的函数，2)在恒定温度下监测Z(w)作为施加偏置电压的函数，3）在恒定温度下测量Z(w)作为氧分压的函数。这一系列实验的结果将为跨越固体半导体/电解质边界的电荷传输过程的本质提供有价值的见解。

The objective of this project is to study the electrical properties of single crystal junctions of Zn0 epitaxially grown on yttria stabilized Zr02 using AC impedance spectroscopy techniques. In AC impedance spectroscopy, the impedance of a sample is measured as a function of frequency, Z(w), and an equivalent circuit representation of the sample is developed using complex plane techniques. Each component in the equivalent circuit represents some physical parameter of the sample. Study of how the components vary with changes in experimental conditions provides insight into the physical processes that govern charge transport. The series of experiments that will be done to study the Zn0/Zr02 single crystal interface are, 1) Z(w) will be monitored as a function of temperature in an inert gas atmosphere, 2) Z(w) will be monitored as a function of applied bias voltage at constant temperature, and 3) Z(w) will be measured as a function of oxygen partial pressure at constant temperature. The results of this series of experiments will provide valuable insight into the nature of the charge transport process across solid semiconductor/electrolyte boundaries.