Ion-Beam and Surface-Analytical Studies of Macromolecular Surfaces

高分子材料表面和界面的研究 在决定结构-性质方面是极其重要的 与粘合技术应用相关的关系， 涂层、生物相容性、降解和反应性。 在这 有机物和聚合物的表面敏感测量 表面描述，基于溅射诱导的和 一次低能惰性气体离子束的散射。 具体地，LB薄膜制备 技术将用于控制结构，方向， 膜的聚合度。 这些将用于 研究产生信息的离子形成过程 关于聚合物链的链长和键合。 将开发二次离子质谱法（西姆斯） 使用LB膜作为聚合物表面的模型系统，还 西姆斯将探测薄膜的界面化学 自己 低能离子散射（ISS）分析 有序聚合物表面的取向将通过 结合分子力学计算的结果， 平均取向，并与实验结果相比， 低损伤条件。 表面组成的研究 嵌段共聚物、相容共混物和表面改性的 聚合物将通过结合电子显微镜， 接触角分析，电子能谱分析 分析（角度相关方法）、ISS和傅立叶变换 红外光谱法以获得完整的描述 表面和聚合物界面的动力学。

The study of the surfaces and interfaces of polymeric materials is extremely important in determining structure-property relationships relevent to technological applications in adhesion, coatings, biocompatibility, degradation, and reactivity. In this proposal, surface-sensitive measurements of organic and polymeric surfaces are described, based on sputtering induced by and scattering of a primary low-energy noble-gas ion beam. Specifically, Langmuir-Blodgett (LB) thin-film preparation techniques will be used to control structure, orientation, and degree of polymerization of films. These will be utilized to study the ion-formation processes which give rise to information about the chain length and bonding of a polymeric chain. Secondary Ion Mass Spectrometry (SIMS) methods will be developed using the LB film as a model system for the polymer surface, also SIMS will probe the interfacial chemistry of the films themselves. Low-energy Ion Scattering (ISS) analysis of the orientation of ordered polymer surfaces will be studied by combining results from molecular mechanics calculations of average orientation and compared to experimental results under low-damage conditions. Studies of the surface composition of block copolymers, compatible blends, and surface-modified polymers will be accomplished by combining electron microscopy, contact angle analysis, Electron Spectroscopy for Chemical Analysis (angular dependent methods), ISS and Fourier Transform Infrared Spectroscopy to get a complete description of the surface and dynamics of the polymer interface.