MRI:Acquisition of an Imaging Time of Flight Secondary Ion Mass Spectrometer (ToF SIMS)

摘要在主要研究仪器（MRI）采购计划的支持下，纽约州立大学布法罗分校化学系将获得一台成像飞行时间二次离子质谱仪（ToF西姆斯）该设备将加强与材料研究有关的若干领域的研究a）自旋电子学科学和工程材料; B）纳米材料（包括颗粒、线、复合材料）; c）聚合物和聚合物生物材料，以及d）基于生物材料的传感器。 成像飞行时间二级质谱仪使研究人员能够探测表面和薄膜的化学成分。 该技术用在离子源中制备的离子轰击表面。 这会从质谱仪分析的表面去除材料。 这会探测表面几个原子层的深度，提供深度剖面。 离子束还将扫描材料，给出表面的三维图像。 这使得研究人员能够在纳米级水平上将化学成分与材料和器件的特性相关联。使用该仪器进行的跨学科研究将对材料、物理、化学、生物物理化学、地质学和工程学产生影响。本科生和研究生谁将使用他们的研究项目的设备将直接引入成像科学和纳米技术。

ABSTRACTWith support from the Major Research Instrumentation (MRI) Acquisition Program, the Department of Chemistry at SUNY at Buffalo will obtain a Imaging Time of Flight Secondary Ion Mass Spectrometer (ToF SIMS) This equipment will enhance research in a number of areas related to materials research a) materials for spintronics science and engineering; b) nanomaterials (including particles, wires, composites); c) polymers and polymeric biomaterials, and d) sensors based on biomaterials. The Imaging Time of Flight Secondary Mass Spectrometer enables researchers to probe the chemical composition of surfaces and thin films. The technique bombards a surface with ions prepared in an ion source. This dislodges material from the surface that is analyzed by the mass spectrometer. This probes the surface several atom layers deep providing a depth profile. The ion beam will also scan over the material giving a three dimionsional image of the surface. This allows researchers to correlate the chemical composition with the properties of materials and devices at the nano scale level. The interdisciplinary studies that will be carried out using this instrument will have an impact in materials, physics, chemistry, biophysical chemistry, geology and in engineering. The undergraduate and graduate students who will use the equipment for their research projects will be directly introduced to imaging science and nanotechnology.