Bonding, Stability and Structure in Isoelectronic Solids

将研究过渡金属与p-块元素化合物的化学键的性质和强度，重点是等电子系列化合物的趋势。该研究项目包括通过质量损失渗透、流出-质谱仪和高温固态电偶电池测量热力学稳定性和键强度，用X-射线光电子能谱研究核能级和价传导带区，以及用KKR和扩展休克尔方法计算能带结构。其目标是加深对固体中键的理解，特别是与键强度和结构有关的键，获得关于热力学稳定性的高质量数据，并开发考虑到对化学键性质的最佳见解来预测稳定性的方法。

Studies will be made of the nature and strength of chemical bonding in compounds of transition metals with p-block elements with focus on trends in isoelectronic series of compounds. The research program includes measurement of thermodynamic stabilities, and bond strengths, by mass-loss effusion, effusion- mass spectrometry, and high temperature solid-state galvanic cells, x-ray photoelectron spectroscopic studies of both core levels and valence-conduction band regions, and band structure calculations by both KKR and Extended Huckel methods. The goals are to deepen the understanding of bonding in solids, especially in relation to bond strength and structure, obtain high quality data on thermodynamic stability, and develop ways of predicting stabilities which take into account the best insights available about the nature of chemical bonding.