Acquisition of an Analytical Scanning Electron Microscope

扫描电子显微镜将用作支持弗吉尼亚大学材料研究的主要设施。该设施将包括高分辨率二次和背散射电子成像、沟道、阴极发光成像以及波长和能量色散 X 射线分析的功能。 目前和计划的研究涉及 1) 电化学、电催化和腐蚀，2) 环境疲劳和断裂，3) 合金氧化，4) 复合材料，5) 材料加工，6) 电子材料和器件，7) 地球化学和 8) 轻质高温合金。 所提议的设施对于上述研究领域对于各种材料研究的形貌、成分、方向和完善的详细表征至关重要。

The Scanning Electron Micoscope is to be used as a major facilitfor the support of Materials Research at the University of Virginia. This facility will include capabilities for high resolution secondary and back scattered electron imaging, channeling, cathodoluminescence imaging, as well as wavelength and energy dispersive X-ray analysis. Current and planned research involves studies of 1) electrochemistry, electrocatalysis, and corrosoion, 2) environmental fatigue and fracture, 3) oxideation of alloys, 4) compositie materials, 5) processing of materials, 6) electronic materials and evices, 7) geochemistry and 8) light weight, high temperature alloys. The proposed facility is essential in the above research areas for the detailed characterization of topography, composition, orientation and perfection of the various materials studies.