Upgrading of the Linear-type Pulsed-Laser-Time-of-Flight Atom Probe Field Ion Microscopes

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Linear-type Pulsed Laser Time-of-Flight Atom Probe FIM is a mass and ion kinetic energy analyzer with sensitivity to detect single ions. It can be used for the chemical analysis of solid surfaces, atomic layer by atomic layer, and can also be used to measure ion kinetic energy distributions. It has a resolution of 1 to 2 parts in 100,000 and a time resolution of better than 20 fs in ion reaction rate measurements. It has been used for atomic scale surface and interface compositional analysis of various materials, and to study atomic and cluster ion formation in stimulated desorptions, gas-surface interactions, and ion reactions, etc. It is a unique prototype system.