Electronic Materials Management and Simulation Laboratory Improvement

电子材料管理和模拟实验室改进

• 批准号: 8951673
• 负责人: Albert Henning
• 金额: $ 4.7万
• 依托单位: Dartmouth College
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1990
• 资助国家: 美国
• 起止时间: 1990-04-01 至 1992-03-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8951673&HistoricalAwards=false
• 关键词: Electronic; Materials; Management; Simulation; Laboratory

Electronic materials (including thin film metallization, semiconductors, and high temperature superconductors) will continue to play a dominant role in our nation's technological development for the foreseeable future. Dartmouth graduates have played leading roles in these developments in the past. These improvements will ensure our students have the superior training needed to continue to command leadership positions. Measurement of electronic materials will be enhanced first by purchase of an ellipso-meter to characterize thin films fabricated in the materials laboratories. Second, existing capacitance-voltage measurement capability will be upgraded to a cost-effective, state-of-the-art system. Third, development of a new course in optical properties of materials will be enhanced by construction of a photon measurement system with high sensitivity and spectrographic capability. Finally, teaching of the electronic and mechanical properties of materials will be improved by a pilot enhancement to our existing workstation-based computer laboratory, Project NORTHSTAR. A Silicon Graphics workstation will be used to develop pilot software to display the energy band structure or mechanical stress properties of a material, based on a user-supplied solid-state crystal structure and user-selected physical models.

在可预见的未来，电子材料（包括薄膜金属化、半导体和高温超导体）将继续在我国的技术发展中发挥主导作用。达特茅斯学院的毕业生在过去的这些发展中发挥了主导作用。这些改进将确保我们的学生获得继续担任领导职务所需的卓越培训。电子材料的测量将首先通过购买椭圆计来增强，以表征在材料实验室制造的薄膜。其次，现有的电容电压测量能力将升级为具有成本效益的最先进系统。第三，建设具有高灵敏度和光谱能力的光子测量系统将促进材料光学性质新课程的发展。最后，材料的电子和机械性能的教学将通过对我们现有的基于工作站的计算机实验室NORTHSTAR项目的试点改进而得到改善。硅图形工作站将用于开发试点软件，以用户提供的固态晶体结构和用户选择的物理模型为基础，显示材料的能带结构或机械应力特性。