Scanning Tunnelling Microscopy of Platinum Single Crystals and Platinum Supported Cataysts

在本研究中，扫描隧道显微镜（STM）与x射线光电子能谱结合使用，监测了各种处理后铂单晶和模型石墨负载铂催化剂的表面，包括使用样品作为环己烯芳构化的催化剂。研究了几种晶体平面，包括低米勒指数和高米勒指数的晶体平面。将单晶研究与模型催化剂研究进行比较，以确定STM扫描的哪些特征与催化性能有关。这本质上是一项基线研究，旨在为STM在催化研究中的应用建立可靠性指南。原则上，这种相对较新的技术具有很大的潜力，可以揭示迄今为止不可能检测到的反应系统的表面特征。

In this study, scanning tunnelling microscopy (STM) is used in conjunction with X-ray photoelectron spectroscopy to monitor the surfaces of platinum single crystals and model graphite- supported platinum catalysts following a variety of treatments, including use of the samples as catalysts for cyclohexene aromatization. Several crystal planes are studied, including some with low and some with high Miller indices. Single-crystal studies are compared with model catalyst studies to ascertain which features of the STM scans are relevant to catalytic performance. This is essentially a baseline study to establish reliability guidelines for application of STM in catalysis research. In principle, this relatively new technique has great potential to reveal surface features in reacting systems heretofore impossible to detect.