Acquisition of a General Purpose Diffraction System

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This x-ray diffraction system is suitable for powder diffraction experiments, single crystal and thin film work, and is equipped with a full Eulerian specimen carrier for texture measurements. Access to this fully automatic, user-friendly system will be made to faculty and students throughout the University, in need of rapid specimen characterization, and will be incorporated in a teaching laboratory for training of students. Materials research efforts currently underway include: the local arrangement of point defects in non-stoichiometric oxides; studies of mercury-cadmium-telluride II-IV semiconductors to determine the state of local chemical order and atomic displacements; studies in iron-nickel-carbon steels to elucidate the effects of carbon ordering on matensite formation and determination of phase fractions and lattice paramaters of steels; determination of periodicities in two dimensions in metal-metal, metal-ceramic, and metal-semiconductor interfaces; residual stress measurements in microcracking ceramics, and phase characterization of zirconia oxide thermal barrier coatings.