On Testing and Diagnosis of Bridging and Leakage Faults in CMOS Circuits Using Current Monitors

利用电流监视器测试和诊断CMOS电路桥接和漏电故障

• 批准号: 9102509
• 负责人: Sreejit Chakravarty
• 金额: $ 16.35万
• 依托单位: SUNY at Buffalo
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1991
• 资助国家: 美国
• 起止时间: 1991-09-15 至 1994-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9102509&HistoricalAwards=false
• 关键词: Testing; Diagnosis; Bridging; Leakage; Faults

This research is on the test and diagnostic tools for bridging and leakage faults, and to build a comprehensive fault model for these faults. The approach is to utilize current monitoring techniques, which provide better observability than present response generators. This technique is being used to develop simpler, more efficient, more effective algorithms which will form the basis for a new set of test tools. Algorithms for computing test strings for partial scan, test generators for built-in-self-test, fault simulation, and diagnostic tools are being explored. The impact of these algorithms on circuit design is also being explored through the building of tools based on the algorithms

研究桥接和漏电故障的检测诊断工具，建立桥接和漏电故障的综合故障模型。方法是利用目前的监测技术，这些技术比目前的响应发生器提供更好的可观察性。这项技术正被用于开发更简单、更高效、更有效的算法，这些算法将构成一套新的测试工具的基础。部分扫描的测试字符串计算算法、内置自检的测试生成器、故障模拟和诊断工具正在探索中。这些算法对电路设计的影响也正在通过基于算法的工具的构建进行探索