On Testing and Diagnosis of Bridging and Leakage Faults in CMOS Circuits Using Current Monitors

这项研究是关于桥接和 泄漏故障，并建立一个全面的故障模型，这些 断层 方法是利用现有的监测技术， 其提供比当前响应更好的可观测性 发生器. 这项技术被用来开发更简单，更 更有效的算法，这将构成基础， 新的测试工具。 计算测试字符串的算法 部分扫描，内建自测试的测试发生器，故障 正在探索模拟和诊断工具。 的影响 对这些算法在电路设计中的应用也进行了探讨 通过构建基于算法的工具

This research is on the test and diagnostic tools for bridging and leakage faults, and to build a comprehensive fault model for these faults. The approach is to utilize current monitoring techniques, which provide better observability than present response generators. This technique is being used to develop simpler, more efficient, more effective algorithms which will form the basis for a new set of test tools. Algorithms for computing test strings for partial scan, test generators for built-in-self-test, fault simulation, and diagnostic tools are being explored. The impact of these algorithms on circuit design is also being explored through the building of tools based on the algorithms