Development of an Undergraduate High Speed Microelectronics Testing Laboratory at Florida A&M University.

本计画建立超高速积体电路 （VHSIC）本科电气测试实验室 FAMU/FSU工程学院的工程专业学生。 该实验室提供实用的测试方法， 通过一系列的实验，为高年级学生提供VHSIC 其中涵盖了函数和参数的基本原理 试验.实验室是本科生的补充 微电子学课程，包括固态课程 器件，数字和模拟IC设计，以及计算机辅助- 超大规模集成电路（VLSI）的设计（CAD）。 有了新设备，学生们学习开关 属于高速微电子器件的特性 到诸如发射极耦合逻辑（ECL）、高- 加速互补金属氧化物半导体（HCMOS），以及 砷化镓金属-半导体场效应 晶体管（MESFET）。电气工程专业完成 实验室实验序列获得了全面的 高速集成电路知识

This project establishs a very-high-speed integrated circuit (VHSIC) testing laboratory for undergraduate electrical engineering students at the FAMU/FSU College of Engineering. This laboratory provides practical testing methodologies of VHSIC for senior-level students through a series of experiments which cover the fundamentals of functional and parametric testing. The laboratory supplements the undergraduate Microelectronics Program which includes courses in solid-state devices, digital and analog IC design, and the computer aided- design (CAD) of very large scale integration (VLSI) circuits. With the new equipment, the students study the switching characteristics of high-speed microelectronic devices belonging to logic families such as emitter-coupled logic (ECL), high- speed complementary-metal-oxide-semiconductor (HCMOS), and gallium arsenide (GaAs) metal-semiconductor field-effect transistors (MESFET). Electrical engineering majors completing the sequence of laboratory experiments gain a comprehensive knowledge of high-speed IC