Acquisition of Instrumentation for Surface Analysis of Engineered Materials

购置工程材料表面分析仪器

• 批准号: 9203323
• 负责人: William Mullins
• 金额: $ 4.5万
• 依托单位: Purdue Research Foundation
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1992
• 资助国家: 美国
• 起止时间: 1992-09-01 至 1994-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9203323&HistoricalAwards=false
• 关键词: Acquisition; Instrumentation; Surface; Analysis; Engineered

This project is for the upgrade and acquisition of control electronics for a scanning Auger microprobe and X-ray photoelectron spectrometer that was donated to the university. This will have a beneficial effect on several different research groups at the university and allow many others to benefit from the facility. Examples of research projects that will make use of this instrument are investigations of ferroelectric films, mechanical studies of structural ceramics, analysis of Si-SiO2-metal device structures, investigations into plasma etching, electronic materials studies examining high-Tc superconducting thin film and bulk materials.

这个项目是为升级和收购的控制 扫描俄歇微探针电子学和X射线光电子学 这是捐赠给大学的光谱仪。 这将具有 对几个不同的研究小组产生了有益的影响 大学，并允许许多其他人从设施中受益。 将利用这一工具的研究项目的例子 铁电薄膜的研究， 结构陶瓷，Si-SiO2-金属器件结构分析， 等离子体蚀刻研究、电子材料研究 检测高温超导薄膜和块体材料。