MRI-R2: Acquisition of an X-ray Photoelectron Spectroscopy (XPS) Surface Analysis Instrumentation for Enabling Research and Education in Greater Philadlephia

MRI-R2：购买 X 射线光电子能谱 (XPS) 表面分析仪器，以促进大费城的研究和教育

• 批准号: 0959361
• 负责人: Kenneth Lau
• 金额: $ 112.5万
• 依托单位: Drexel University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-07-01 至 2013-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0959361&HistoricalAwards=false
• 关键词: MRI; R2; Acquisition; ray; Photoelectron

0959361Lau"This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5)."This proposed MRI-R2 application is for the acquisition of a state-of-the-art x-ray photoelectron spectroscopy (XPS) surface analysis instrumentation system for the Greater Philadelphia region. The XPS system will be established as an openly accessible multi-user shared instrumentation facility at Drexel University that serves as a focal point for significantly enabling research and training activities in the scientific community in the region. Currently, there is no shared XPS facility widely accessible by different users in Greater Philadelphia. Equally important, there are a significant and diverse range of research programs In the area that have a critical need for an XPS system but have limited access to one. As such, the proposed instrumentation will address a key void in enabling leading edge research. At Drexel University, major research initiatives, including the Drexel Plasma Institute and the Drexel Nanotechnology Institute, as well as many individual faculty research projects will be enabled by the XPS system. In addition, numerous research efforts at the University of Pennsylvania, Villanova University and Rowan University will be considerably aided by easy access to such an system. Specifically, this proposal highlights emerging research activities that will be positively impacted by the XPS instrumentation, including major efforts in sustainable energy, biomedical technology, nanotechnology and advanced materials currently funded by the NSF and other agencies. These research activities require a multicapability XPS system that is able to perform quantitative surface-specific chemical analysis of all types of samples like metals, inorganics, organics, ceramics, polymers and composites. The system will provide for these research activities macro- and micro-area elemental and chemical state spectroscopy and imaging, angle resolved depth analysis, sputter depth profiling using argon and polyatomic ion guns for hard and soft materials, respectively, in situ variable temperature measurements, and Auger electron spectroscopy (AES) for spectroscopy and mapping with a spatial resolution below 100 nm.

0959361 Lau“该奖项由2009年《美国复苏和再投资法案》（公法111-5）资助。“这项拟议的MRI-R2应用是为大费城地区收购最先进的X射线光电子能谱（XPS）表面分析仪器系统。XPS系统将在德雷克塞尔大学建立，作为一个开放的多用户共享仪器设施，作为该区域科学界开展研究和培训活动的一个协调中心。目前，在大费城没有可供不同用户广泛使用的共享XPS设施。同样重要的是，在对XPS系统有迫切需求但获得XPS系统的机会有限的领域，有大量不同的研究项目。因此，拟议的仪器将解决一个关键的空白，使前沿研究。在德雷克塞尔大学，主要的研究计划，包括德雷克塞尔等离子体研究所和德雷克塞尔纳米技术研究所，以及许多个别教师的研究项目将通过XPS系统启用。此外，宾夕法尼亚大学、维拉诺瓦大学和罗文大学的许多研究工作也将因方便使用这种系统而得到很大帮助。具体而言，该提案强调了将受到XPS仪器积极影响的新兴研究活动，包括目前由NSF和其他机构资助的可持续能源，生物医学技术，纳米技术和先进材料方面的重大努力。这些研究活动需要一个多功能XPS系统，能够对所有类型的样品（如金属、无机物、有机物、陶瓷、聚合物和复合材料）进行定量表面特定化学分析。该系统将为这些研究活动提供宏观和微观区域元素和化学状态光谱学和成像、角度分辨深度分析、分别使用氩和多原子离子枪对硬材料和软材料进行溅射深度剖析、现场可变温度测量以及空间分辨率低于100纳米的俄歇电子光谱学光谱学和绘图。