Development of Integrated On-Line and Off-Line Error Detection Mechanisms in the Coding Theory Framework

Pradhan 本研究的重点是开发一个统一的框架相结合的在线和离线错误检测机制，在芯片和板级。 这一框架包括：用于在线检测的设备的并行检查、测试响应的空间和时间压缩、用于错误检测和诊断的所得签名中的失真的分析以用于内建自测试（BIST），以及用于（BIST）所需的硬件的并行检查。

Pradhan This research focuses on the development of a unified framework for combining on-line and off-line error detection mechanisms at both the chip and board levels. This framework includes: concurrent checking of the device for on-line detection, space and time compression of test responses, analysis of distortions in the resulting signatures for error detection and diagnosis for built-in self testing (BIST), and concurrent checking of hardware required for (BIST).