Design, Characterization, and Electron Hopping Properties ofThin Molecular Films

分子薄膜的设计、表征和电子跳跃特性

• 批准号: 9221118
• 负责人: Royce Murray
• 金额: $ 18.5万
• 依托单位: University of North Carolina at Chapel Hill
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1993
• 资助国家: 美国
• 起止时间: 1993-05-01 至 1994-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9221118&HistoricalAwards=false
• 关键词: Design; Characterization; Electron; Hopping; Properties

This award, made in the Advanced Materials and Processing Program, extends support for the research of Murray and coworkers on the design, characterization and electronic properties of thin molecular films. The goals of the research are to (1) study the electrochemical formation of ultrathin dielectric and conductive films with discrete electron-hopping sites by in-situ atomic force microscopy (AFM) and ellipsometry; (2) Prepare nanostructures by using the AFM tip to create patterned holes in the films and to re-deposit other thin film materials in the holes, and (3) study transport properties of mixed valent molecular films which lack ionic conductivity by measuring the Hall effect and magnetoresistance. Assemblies of the films will be utilized in electron and hole-injecting contacts, rectifying molecular junctions, thin film transistors and molecular light emitting devices. %%% This highly interdisciplinary research will explore the underlying fundamental chemistry of thin film synthesis and characterization, develop new technology for producing nanostructures and advance the understanding of the physics of devices where charge transport is controlled by electron-hopping.

该奖项是在先进材料和加工 该计划，扩大了对默里研究的支持， 设计、表征和电子方面的合作者 分子薄膜的性质。研究的目标 主要是（1）研究电化学形成的 具有离散电子跳跃的介电和导电膜 通过原位原子力显微镜（AFM）和 （2）利用AFM针尖制备纳米结构 以在膜中产生图案化的孔并重新沉积其它的 薄膜材料的孔，和（3）研究输运 缺乏离子的混合价分子膜的性质 通过测量霍尔效应测量电导率， 磁阻效应这些膜的组件将用于 电子和空穴注入接触，整流分子 结、薄膜晶体管和分子发光 装置. %%% 这项高度跨学科的研究将探讨 薄膜合成的基础化学， 表征，开发新的生产技术 纳米结构和推进物理的理解， 其中电荷传输由 电子跳跃