NSF Young Investigator Award

NSF青年研究员奖

• 批准号: 9258115
• 负责人: Zhigang Suo
• 金额: --
• 依托单位: University of California-Santa Barbara
• 依托单位国家: 美国
• 项目类别: Continuing grant
• 财政年份: 1992
• 资助国家: 美国
• 起止时间: 1992-08-15 至 1997-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9258115&HistoricalAwards=false
• 关键词: NSF; Young; Investigator; Award

This is an NYI award for FY 92. The research will focus on two areas: (1) diffusive voiding in metallizations caused by electromigration and thermal stress, and (2) mechanics of ferroelectric ceramics. The first problem area involves diffusive voiding in metal interconnects in very large-scale integrated (VLSI) circuits. A unified approach to thermal voiding and electromigration will be developed that will establish the explicit dependence of the phenomena on design variables such as material properties, current density, thermal history and interconnect configuration. This will enable the mathematical model so created to be validated by comparison to a variety of experimental results. The second problem area is concerned with deformation, polarization and degradation of ferroelectric ceramics. The research will provide an analytical framework relating the mechanisms of domain wall motion and twinning to macroscopic response between stress, electric field, deformation and polarization of ferroelectric ceramics. This physically-based constitutive relation would be used to study the important phenomena of fatigue cracking under alternating electric fields.

这是92财年的NI奖。这方面的研究将集中在两个方面：(1)电迁移和热应力引起的金属化中的扩散空化；(2)铁电陶瓷的力学。第一个问题涉及超大规模集成电路(VLSI)中金属互连中的扩散空穴。将开发一种统一的热空化和电迁移方法，该方法将建立这些现象与设计变量(如材料特性、电流密度、热历史和互连配置)的显式依赖。这将使所创建的数学模型能够通过与各种实验结果的比较来验证。第二个问题涉及铁电陶瓷的变形、极化和退化。这项研究将提供一个分析框架，将磁化壁运动和孪生机制与铁电陶瓷的应力、电场、变形和极化之间的宏观响应联系起来。这种基于物理的本构关系将被用来研究交变电场下疲劳开裂的重要现象。