NSF Young Investigator

9357444 Hsu这是一个新的青年研究者奖，主要研究介观尺度（0.01 - 1 m）的材料物理问题。该项目将研究这种长度尺度的变化如何影响系统的宏观行为。特别令人感兴趣的是光学和电子性质对结构变化（如有序和无序）和附近缺陷的依赖。这项研究将使用扫描表面显微镜，特别是近场扫描光学显微镜。这些信息具有根本性的重要性，并且在超小型电子设备的背景下具有技术相关性。这是针对介观尺度（0.01 - 1 m）材料物理问题的新青年研究者奖，即在系统的物理尺寸与原子取代基，特别是电子的量子尺寸或波长相似的尺度上。该项目将研究这种长度尺度的变化如何影响宏观、大尺度的行为，如粒子的光学和电阻率特性。特别令人感兴趣的是光学和电子性质对结构变化（如有序和无序）和附近缺陷的依赖。这项研究将使用扫描表面显微镜，特别是近场扫描光学显微镜。这些信息具有根本性的重要性，并且在超小型电子设备的背景下具有技术相关性。＊＊＊

9357444 Hsu This is a New Young Investigator Award for materials physics research focusing on problems at the mesoscopic scale (0.01 - 1 m). The project will investigate how changes at this length scale affect macroscopic behavior of a system. Of particular interest is the dependence of optical and electronic properties on structure variations (such as order and disorder) and nearby defects. The research will employ scanning surface microscopies, particularly the near-field scanning optical microscope. The information is of fundamental importance and has technical relevance in the context of ultrasmall electronic devices. %%% This is a New Young Investigator Award for materials physics problems at the mesoscopic scale (0.01 - 1 m), that is at the scale where the physical dimensions of the system become similar to the quantum size or wavelength of atomic substituents, particularly electrons. The project will investigate how changes at this length scale affect macroscopic, large-scale behavior, such as the optical and resistivity properties of the particles. Of particular interest is the dependence of optical and electronic properties on structure variations (such as order and disorder) and nearby defects. The research will employ scanning surface microscopies, particularly the near-field scanning optical microscope. The information is of fundamental importance and has technical relevance in the context of ultrasmall electronic devices. ***