NSF Young Investigator

NSF 青年研究员

• 批准号: 9357444
• 负责人: Julia Hsu
• 金额: $ 31.25万
• 依托单位: University of Virginia Main Campus
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1993
• 资助国家: 美国
• 起止时间: 1993-08-01 至 1999-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9357444&HistoricalAwards=false
• 关键词: NSF; Young; Investigator

9357444 Hsu This is a New Young Investigator Award for materials physics research focusing on problems at the mesoscopic scale (0.01 - 1 m). The project will investigate how changes at this length scale affect macroscopic behavior of a system. Of particular interest is the dependence of optical and electronic properties on structure variations (such as order and disorder) and nearby defects. The research will employ scanning surface microscopies, particularly the near-field scanning optical microscope. The information is of fundamental importance and has technical relevance in the context of ultrasmall electronic devices. %%% This is a New Young Investigator Award for materials physics problems at the mesoscopic scale (0.01 - 1 m), that is at the scale where the physical dimensions of the system become similar to the quantum size or wavelength of atomic substituents, particularly electrons. The project will investigate how changes at this length scale affect macroscopic, large-scale behavior, such as the optical and resistivity properties of the particles. Of particular interest is the dependence of optical and electronic properties on structure variations (such as order and disorder) and nearby defects. The research will employ scanning surface microscopies, particularly the near-field scanning optical microscope. The information is of fundamental importance and has technical relevance in the context of ultrasmall electronic devices. ***

9357444 Hsu这是一个新的青年研究者奖，用于材料物理研究，重点是介观尺度（0.01 - 1 m）的问题。 该项目将研究在这个长度尺度上的变化如何影响系统的宏观行为。 特别感兴趣的是光学和电子性质对结构变化（如有序和无序）和附近缺陷的依赖性。 研究将采用扫描表面显微镜，特别是近场扫描光学显微镜。 这些信息具有根本的重要性，在超小型电子设备方面具有技术相关性。 这是一个新的青年研究者奖的材料物理问题在介观尺度（0.01 - 1米），这是在规模的系统的物理尺寸变得类似于量子尺寸或原子取代物的波长，特别是电子。 该项目将研究这种长度尺度的变化如何影响宏观的大尺度行为，例如粒子的光学和电阻率特性。 特别感兴趣的是光学和电子性质对结构变化（如有序和无序）和附近缺陷的依赖性。 研究将采用扫描表面显微镜，特别是近场扫描光学显微镜。 这些信息具有根本的重要性，在超小型电子设备方面具有技术相关性。 ***