NSF Young Investigator
NSF Young Investigator
批准号:
9357535
负责人:
Jonathan Pelz
金额:
$0.0万
依托单位国家:
美国
项目类别:
Continuing grant
财政年份:
1993
资助国家:
美国
项目状态:
已结题
起止时间:
1993-08-15 至 2000-01-31
关键词:
中文摘要
9357535 Pelz表面和界面的微观电子和结构现象将主要使用STM相关技术进行研究。计划开展的工作包括:(1)高温氧化反应中原子表面运动的研究,(2)半导体异质结构中位错的局部电子性质,(3)绝缘材料薄膜中的局部电子注入。 ***
英文摘要
9357535 Pelz Microscopic electronic and structural phenomena at surfaces and interfaces will be studied, primarily using STM-related techniques. Planned work includes: (1) study of atomic surface motions during oxidation reactions at elevated temperatures, (2) local electronic properties of dislocations in semiconductor heterostructures, and (3) local electron injection into thin films of insulating materials. ***
期刊论文(0)
专著(0)
科研奖励(0)
会议论文
Nanometer-Scale Studies of Contacts to Nanowires, Advanced Oxide Films, and Molecular Layers
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批准号:0805237
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项目类别:Standard Grant
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资助金额:$33.62万
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财政年份:2008
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负责人:Jonathan Pelz
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依托单位:
Microscopic Studies of Schottky Barrier Nano-Contacts and Nano-Structured Metal/Semiconductor and Metal/Insulator Interfaces
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批准号:0505165
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项目类别:Continuing grant
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资助金额:$0.0万
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财政年份:2005
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负责人:Jonathan Pelz
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依托单位:
Nanoscale Structure and Dynamics of Self-Organized Steps on Silicon Surfaces
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批准号:0074416
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项目类别:Standard Grant
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资助金额:$0.0万
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财政年份:2000
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负责人:Jonathan Pelz
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依托单位:
Acquisition of a Variable-Temperature Scanning Tunneling Microscope and X-Ray Photoelectron Spectroscopy Facility for a Molecular Beam Epitaxy System
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批准号:9601598
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项目类别:Standard Grant
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资助金额:$28.19万
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财政年份:1996
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负责人:Jonathan Pelz
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依托单位:
海外基金