Detection and Imaging of Nanoscale Defects

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9402599 Gidley An interdisciplinary research program will be undertaken that combines the well known defect sensitivity of positron techniques with state-of-the-art positron beam technology in order to detect and image the early stages of microstructural damage in a wide range of engineering materials where traditional techniques are not adequate. The inability to characterize defect evolution on the nanometer size scale represents a major missing link in the fundamental knowledge of the synthesis-to-failure life cycle of many engineering materials. If materials scientist can measure the microstructural evolution of damage from synthesis to failure they will be greatly facilitated in improving such material properties as strength and durability, wear and corrosion resistance, environmental compatibility, and fabrication cost effectiveness. ***