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Surface and Thin Film Investigations with Low Energy Positrons

Surface and Thin Film Investigations with Low Energy Positrons
低能正电子的表面和薄膜研究
批准号：
9003987
负责人：
David Gidley
金额：
$12.5万
依托单位：
Regents of the University of Michigan - Ann Arbor
依托单位国家：
美国
项目类别：
Continuing Grant
财政年份：
1990
资助国家：
美国
项目状态：
已结题
起止时间：
1990-06-15 至 1994-11-30
来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=9003987&HistoricalAwards=false
关键词：
SurfaceThinFilmInvestigationsLow

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中文摘要
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英文摘要
Experimental program employing monoenergetic, low-energy beams of positrons to investigate the structural and electronic properties of multilayer heterostructures. The techniques of reemitted positron spectroscopy, positronium formation fraction, and Doppler broadening of annihilation radiation will be used in a depth profiling mode to study (1) positron transport, esp. effects at metal-Si and Si-silicide interfaces, (2) positron tunneling microscopy, and (3) thermalization of hot positrons and ground state formation in thin metal films.
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会议论文
Tests of QED with Positronium
Characterization of Nanoscale Defects and Pores
Investigations of Lepton Interactions
Detection and Imaging of Nanoscale Defects
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