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RESEARCH EQUIPMENT GRANT: Atomic Force Microscope for High Resolution X-ray Microscopy

RESEARCH EQUIPMENT GRANT: Atomic Force Microscope for High Resolution X-ray Microscopy
研究设备补助金:用于高分辨率 X 射线显微镜的原子力显微镜
批准号:
9412008
负责人:
Martin Richardson
金额:
$5.67万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1994
资助国家:
美国
项目状态:
已结题
起止时间:
1994-08-01 至 1996-07-31

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中文摘要
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英文摘要
9412008 Richardson A high-resolution atomic force microscope will be purchased. This instrument is urgently needed to sustain rapid progress in the development of high resolution x-ray microscopy. X-ray microscopy is now a pivotal core technology to the use of in-vitro analysis of sub-cellar features of biological structures each as human chromosomes, and to the development of x-ray assayiny techniques for computer chip manufacture. We have established at the Laser Plasma Laboratory (LPL) at CREOL, the only university development program in the these technologies that is based on the promising use of compact laser plasma sources. Six faculty members and over 15 graduate and undergraduate students are associated with this program. In the past year, our success in establishing a dedicated laser plasma x-ray microscopy facility has resulted in the wide recognition of the potential this technology, and broad interest expressed by a large number of researchers, in this country and abroad, in partnering with us to bring this technology to the threshold for commercial development. Moreover, to encourage the latter, we are now collaborating with a number of American companies who wish to exploit this technology. ***
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