Support for Student Travel Awards to the 11th International Conference on Secondary Ion Mass Spectrometry, SIMS XI

该奖项来自化学学部的分析和表面化学项目，为参加1997年二次离子质谱（SIMS）会议的5名或更多研究生提供部分支持。这是两年一次的国际会议，是传播SIMS信息的最大国际论坛。学生将被邀请展示他们的研究成果。这次会议是在美国质谱学会的主持下举行的。来自工业界，政府和学术机构的科学家被吸引到该计划，并将为学生提供广泛接触SIMS各个方面的机会。主题将包括以下内容：表面分析，仪器仪表的发展，深度剖面，半导体应用，冶金和地质应用，以及溅射的基本原理。该奖项使研究生能够参加1997年二次离子质谱（SIMS）会议。会议提供了涉及SIMS的科学活动的广阔视野。

This award from the Analytical and Surface Chemistry Program of the Division of Chemistry provides partial support to enable the participation of five or more graduate students at the 1997 Secondary Ion Mass Spectrometry (SIMS) Meeting. This is a biennial international meeting and represents the largest international forum for dissemination of information on SIMS. Students will be invited to present their research. The meeting is held under the auspices of the American Society for Mass Spectrometry. Scientists from industry, government and academic institutions are attracted to the program and will provide students with broad exposure to all aspects of SIMS. Topics will include the following: surface analysis, developments in instrumentation, depth profiling, semiconductor applications, metallurgical and geological applications, and fundamentals of sputtering. This award enables participation of graduate students in the 1997 Secondary Ion Mass spectrometry (SIMS) Meeting. The conference provides a broad view of scientific activities involving SIMS.