Support for Student Travel Awards to the 11th International Conference on Secondary Ion Mass Spectrometry, SIMS XI

支持学生参加第 11 届二次离子质谱国际会议 SIMS XI 的旅行奖

• 批准号: 9710941
• 负责人: Judith Sjoberg
• 金额: --
• 依托单位: American Society for Mass Spectrometry
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1997
• 资助国家: 美国
• 起止时间: 1997-07-15 至 1998-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9710941&HistoricalAwards=false
• 关键词: Support; Student; Travel; Awards; 11th

This award from the Analytical and Surface Chemistry Program of the Division of Chemistry provides partial support to enable the participation of five or more graduate students at the 1997 Secondary Ion Mass Spectrometry (SIMS) Meeting. This is a biennial international meeting and represents the largest international forum for dissemination of information on SIMS. Students will be invited to present their research. The meeting is held under the auspices of the American Society for Mass Spectrometry. Scientists from industry, government and academic institutions are attracted to the program and will provide students with broad exposure to all aspects of SIMS. Topics will include the following: surface analysis, developments in instrumentation, depth profiling, semiconductor applications, metallurgical and geological applications, and fundamentals of sputtering. This award enables participation of graduate students in the 1997 Secondary Ion Mass spectrometry (SIMS) Meeting. The conference provides a broad view of scientific activities involving SIMS.

化学部的分析和表面化学计划的这个奖项提供了部分支持，使五个或更多的研究生参加1997年二次离子质谱（西姆斯）会议。这是两年一次的国际会议，是传播西姆斯信息的最大国际论坛。学生将被邀请介绍他们的研究。这次会议是在美国质谱学会的赞助下举行的。来自工业，政府和学术机构的科学家被吸引到该计划，并将为学生提供广泛接触西姆斯的各个方面。主题将包括以下内容：表面分析，仪器的发展，深度剖析，半导体应用，冶金和地质应用，以及溅射的基本原理。该奖项使研究生能够参加1997年二次离子质谱（西姆斯）会议。会议提供了涉及西姆斯的科学活动的广泛观点。