Acquisition of a Field Emission Gun Analytical Electron Microscope for the University of Michigan Electron Microbeam Analysis Laboratory

为密歇根大学电子微束分析实验室购置场发射枪分析电子显微镜

• 批准号: 9871177
• 负责人: John Mansfield
• 金额: $ 69万
• 依托单位: Regents of the University of Michigan - Ann Arbor
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1998
• 资助国家: 美国
• 起止时间: 1998-09-01 至 1999-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9871177&HistoricalAwards=false
• 关键词: Acquisition; Field; Emission; Gun; Analytical

9871177MansfieldAnalytical electron microscopy (AEM) is critical to the characterization of metals, ceramics semiconductors, nano-composites, catalysts and geological materials. This Major Research Instrumentation proposal seeks support from NSF for the acquisition of a field emission gun analytical electron microscope (FEG-AEM). This instrument would become the primary analytical electron microscope for materials research, replacing the existing AEMs in the University of Michigan's Electron Microbeam Analysis Laboratory (EMAL). The new FEG-AEM will offer nearly two orders of magnitude higher electron beam current and a factor of three smaller electron probe than the existing instrument. This increase in beam current will mean that analyses may be performed on the nanometer length scale. The new microscope will be located in one of the custom -designed laboratories consisting of 360 square feet of temperature-controlled, low-vibration and low-field space. %%%The new FEG-AEM, to be acquired under the National Science Foundation's Major Research Instrumentation program, will be the primary focus of a wide variety of materials research programs across a wide range of science and engineering disciplines. The active departments include: Materials Science & Engineering, Nuclear Engineering and Radiological Sciences, Chemical Engineering, Electrical Engineering & Computer Science, Applied Physics and Geological Sciences. Over 22 research projects, funded at a total level of over $5M, with 19 faculty, 29 graduate student researchers, and 5 undergraduate students, will be directly impacted by the new FEG-AEM. The new instrument will provide essential capabilities to the University's research programs, attract new research programs and allow the training of graduate students in advanced analytical electron microscopy.***

9871177曼斯菲尔德分析电子显微镜（AEM）对于金属、陶瓷半导体、纳米复合材料、催化剂和地质材料的表征至关重要。 这个主要研究仪器的建议寻求NSF的支持，以获得场发射枪分析电子显微镜（FEG-AEM）。 该仪器将成为材料研究的主要分析电子显微镜，取代密歇根大学电子微束分析实验室（EMAL）现有的AEM。 新的FEG-AEM将提供比现有仪器高近两个数量级的电子束电流和小三倍的电子探针。 电子束电流的增加意味着可以在纳米长度尺度上进行分析。 新的显微镜将位于一个定制设计的实验室，包括360平方英尺的温度控制，低振动和低场空间。新的FEG-AEM将在美国国家科学基金会的主要研究仪器计划下获得，将成为广泛的科学和工程学科中各种材料研究计划的主要焦点。 活跃的部门包括：材料科学工程，核工程和放射科学，化学工程，电气工程计算机科学，应用物理和地质科学。 超过22个研究项目，总资金超过500万美元，有19名教师，29名研究生和5名本科生，将直接受到新的FEG-AEM的影响。 新仪器将为大学的研究项目提供必要的能力，吸引新的研究项目，并允许对研究生进行高级分析电子显微镜的培训。