Acquisition of a Field Emission Gun Analytical Electron Microscope for the University of Michigan Electron Microbeam Analysis Laboratory

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9871177MansfieldAnalytical electron microscopy (AEM) is critical to the characterization of metals, ceramics semiconductors, nano-composites, catalysts and geological materials. This Major Research Instrumentation proposal seeks support from NSF for the acquisition of a field emission gun analytical electron microscope (FEG-AEM). This instrument would become the primary analytical electron microscope for materials research, replacing the existing AEMs in the University of Michigan's Electron Microbeam Analysis Laboratory (EMAL). The new FEG-AEM will offer nearly two orders of magnitude higher electron beam current and a factor of three smaller electron probe than the existing instrument. This increase in beam current will mean that analyses may be performed on the nanometer length scale. The new microscope will be located in one of the custom -designed laboratories consisting of 360 square feet of temperature-controlled, low-vibration and low-field space. %%%The new FEG-AEM, to be acquired under the National Science Foundation's Major Research Instrumentation program, will be the primary focus of a wide variety of materials research programs across a wide range of science and engineering disciplines. The active departments include: Materials Science & Engineering, Nuclear Engineering and Radiological Sciences, Chemical Engineering, Electrical Engineering & Computer Science, Applied Physics and Geological Sciences. Over 22 research projects, funded at a total level of over $5M, with 19 faculty, 29 graduate student researchers, and 5 undergraduate students, will be directly impacted by the new FEG-AEM. The new instrument will provide essential capabilities to the University's research programs, attract new research programs and allow the training of graduate students in advanced analytical electron microscopy.***