Relating Field Data to Accelerated Life Testing

该项目汇集了两个NSF I/UCRC，以改进车辆电子设备的加速寿命测试（ALT）。奥本大学先进车辆电子中心（CAVE）与罗格斯大学和亚利桑那州立大学的质量与可靠性工程（QRE）中心合作，研究了车辆控制器在现场的磨损、退化和故障与实验室进行的ALT结果预期之间的关系。位于阿拉巴马州亨茨维尔的戴姆勒-克莱斯勒电子公司提供了测试平台。由于温度、湿度、循环和其他环境危害，车辆电子设备受到压力。构成控制器的材料易受腐蚀和氧化的影响。连接控制器组件的焊料在高温和热循环应力下会因疲劳和蠕变而开裂。这些故障对车辆性能的影响从轻微到严重不等。该项目的研究将制定一种通用的方法来具体说明加速寿命试验，以便准确地描述该领域将经历的退化和失效。在加速寿命试验的开发过程中，将对现场装置中装配材料的失效机制进行研究。新产品在上市前必须通过ALT标准，这一标准在不过于保守的情况下就足够了，有可能允许新设计和新材料用于汽车电子产品。

EEC-0002669SmithThis project brings together two NSF I/UCRC's to improve accelerated life testing (ALT) of vehicle electronics. The Center for Advanced Vehicle Electronics (CAVE) of Auburn University with partner with the Quality and Reliability Engineering (QRE) Center of Rutgers University and Arizona State University to investigate the relationship between wear, degradation and failure of vehicle controllers as experienced in the field with that expected by the results of ALT conducted in the laboratory. DaimlerChrysler Electronics of Huntsville, Alabama supplies the test bed. Vehicle electronics are subject to stress due to temperature, humidity, cycling and other environmental hazards. The materials that comprise the controllers are susceptible to the effects of corrosion and oxidation. The solder that connects the controller components can crack due to fatigue and creep under high temperature and thermal cycling stresses. These failures affect the performance of the vehicle from slightly to severely. The research of this project will develop a general methodology for specifying accelerated life tests so that they result in an accurate characterization of the degradation and failures that will be experienced in the filed. The failure mechanisms for the assembly materials in field units will be investigated in the development of the accelerated life tests. ALT standards, which new units must pass prior to marketing, will be adequate without being overly conservative, potentially allowing new designs and new materials to be used in vehicle electronics.