Imaging Electronic and Photonic Processes in Nanostructured Interfaces

纳米结构界面中的电子和光子过程成像

• 批准号: 0071734
• 负责人: Paul Barbara
• 金额: $ 37.9万
• 依托单位: University of Texas at Austin
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2000
• 资助国家: 美国
• 起止时间: 2000-07-15 至 2004-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0071734&HistoricalAwards=false
• 关键词: Imaging; Electronic; Photonic; Processes; Nanostructured

Near field scanning optical microscopy is used in this research project supported by the Analytical and Surface Chemistry Program to obtain information on the relationship between the morphology of organic thin films and their physical properties. Professor Barbara and his colleagues at the University of Texas-Austin address issues of charge injection, charge migration, and energy migration in organic thin film materials with applications in organic light emitting diodes and related devices. Method development carried out in the previous award period resulted in approaches which are now focussed on understanding the spatial extent of energy migration in these materials, and the nature of energetic interactions in the layers. Information obtained from these studies is useful in the design and fabrication of state of the art optoelectronic devices. In order to understand the operation of organic thin film light emitting devices, and related optoelectronic materials, high resolution spatial information about physical processes and morphology in the films must be obtained. This research project uses near field scanning probe microscopic methods developed by the P.I. to examine these questions. Information from this research is clearly applicable in electronic and photonic device fabrication problems.

在分析和表面化学计划的支持下，近场扫描光学显微镜被用于这一研究项目，以获得关于有机薄膜的形貌与其物理性质之间的关系的信息。德克萨斯大学奥斯汀分校的Barbara教授和他的同事解决了有机薄膜材料中的电荷注入、电荷迁移和能量迁移问题，并将其应用于有机发光二极管和相关器件。在前一个获奖期间进行的方法开发导致了现在侧重于了解这些材料中能量迁移的空间范围以及各层中能量相互作用的性质的方法。从这些研究中获得的信息对于设计和制造最先进的光电子器件是有用的。为了了解有机薄膜发光器件和相关光电材料的工作原理，必须获得有关薄膜物理过程和形貌的高分辨率空间信息。这项研究项目使用了P.I.开发的近场扫描探针显微镜方法来检查这些问题。这项研究的信息显然适用于电子和光子器件制造问题。