Acquisition of Atomic Force Microscope and Transmission Electron Sample Preparation Equipment to Enhance Materials Science Research Activity

购置原子力显微镜和透射电子样品制备设备以增强材料科学研究活动

• 批准号: 0079546
• 负责人: Sanjay Mishra
• 金额: $ 15.78万
• 依托单位: University of Memphis
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2000
• 资助国家: 美国
• 起止时间: 2000-09-01 至 2001-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0079546&HistoricalAwards=false
• 关键词: Acquisition; Atomic; Force; Microscope; Transmission

0079546MishraThis Major Research Instrumentation project will support the acquisition of an atomic force microscope (AFM) and sample preparation equipment for TEM to enhance materials science research activity at the University of Memphis (UM). The equipment will become part of the Integrated Microscopy Center. The acquisition of the requested equipment will enable investigators from the UM and surrounding institutions to carry out diverse research and training activities in materials science. These activities include: (1) characterization of the surface of orthopedic, dental, and cardiovascular materials and correlation with biological responses to the materials (2) surface and interface investigation of magnetic thin films (3) investigation of the relationship between the surface of metallic materials and their corrosion behavior in various electrolytes. The acquisition of the requested equipment will enhance ongoing projects and facilitate new projects and continued industrial collaborations. Equally important, the requested equipment will be used to train and educate both undergraduate and graduate students in the area of materials science.In the last 30 years, electron microscopy has revolutionized our understanding of the relationship between the structure of materials and their properties. Materials scientists have a growing ability to tailor materials for specific performance properties at even the atomic level. Modern microscopy tools are essential for today's materials research challenges. The acquisition of an atomic force microscope (AFM) and TEM sample preparation equipment will be important additions to the Integrated Microscopy Center (IMC) at the University of Memphis. Modern TEM instruments provide almost all the structural and crystallographic information for analysis of new materials. AFM was developed for imaging surfaces on nearly the atomic scale and has become an established surface analysis tool in scientific and industrial labs. AFM can also measure electrical, magnetic, mechanical and thermal properties on the micron scale. The enhanced IMC will provide increased materials research opportunities and student training in relevant job skills critical to the materials science industry. Through collaborations, training seminars, and community outreach, the equipment will be used as a vehicle for increased interaction with regional universities and industry.

0079546米什拉这一重大研究仪器项目将支持原子力显微镜（AFM）和TEM样品制备设备的收购，以加强孟菲斯大学（UM）的材料科学研究活动。 该设备将成为集成显微镜中心的一部分。 所需设备的采购将使UM和周边机构的研究人员能够在材料科学领域开展各种研究和培训活动。 这些活动包括：（1）骨科、牙科和心血管材料的表面表征以及与材料生物学反应的相关性（2）磁性薄膜的表面和界面研究（3）金属材料表面与其在各种电解质中的腐蚀行为之间关系的研究。 采购所要求的设备将加强正在进行的项目，并促进新项目和持续的工业合作。 同样重要的是，所要求的设备将用于培训和教育材料科学领域的本科生和研究生。在过去的30年里，电子显微镜彻底改变了我们对材料结构与性能之间关系的理解。 材料科学家有越来越多的能力，甚至在原子水平上为特定的性能特性定制材料。 现代显微镜工具对于当今材料研究的挑战至关重要。 原子力显微镜（AFM）和TEM样品制备设备的收购将是孟菲斯大学综合显微镜中心（IMC）的重要补充。 现代TEM仪器提供了几乎所有的结构和晶体学信息，用于分析新材料。 原子力显微镜（AFM）被开发用于在原子尺度上对表面进行成像，并已成为科学和工业实验室中的既定表面分析工具。 原子力显微镜还可以测量微米尺度上的电、磁、机械和热特性。 增强的IMC将提供更多的材料研究机会和对材料科学行业至关重要的相关工作技能的学生培训。 通过合作、培训研讨会和社区外联，这些设备将被用作加强与区域大学和行业互动的工具。