CAREER: Connecting Bulk Properties to Nanoscale Structure: Combined Studies of Structural and Transport Properties of Strongly Correlated Oxide Materials

罗格斯大学的这个教师早期职业发展（Career）项目的目标是研究纳米尺度上的固有不均匀性对几种重要氧化物系统的体积性质的影响。这些不均匀性似乎在这些材料的重要技术特性中起着至关重要的作用，例如超导性、磁电阻和铁电性。为此，x射线和中子散射技术将与体积特性测量相结合。将利用最先进的散射技术，如共振x射线散射，来研究多相态的畴结构，这些状态中的电荷和轨道有序，以及不表现出相分离状态的结构，电荷和轨道波动的性质。在许多情况下，将同时进行散射实验和原位输运测量，以表征亚稳态和时间和历史依赖的效应。该项目所获得的知识有望促进对相关氧化物材料的理解，并有助于设计具有技术上有用特性的新材料。这个项目也包含了一个完整的教育部分。特别是在非理科专业开设现代科学课程，在学生教育中运用反馈技术。随着技术的进步，器件尺寸超过100纳米（十万分之一英寸），微观不均匀性开始在许多技术上重要的材料中发挥关键作用，包括用于计算机芯片、磁存储介质、铁和压电材料的硅基结构。这些材料中有许多属于所谓的过渡金属氧化物家族，具有很强的相关效应。罗格斯大学教师早期职业发展（Career）项目的目标是研究这些材料的微观不均匀性及其与物理性质的联系。为此目的，将使用最先进的实验技术，包括x射线和中子散射与其他实验技术相结合。这项研究将在领先的国家研究实验室以及罗格斯大学进行。从这个项目中获得的知识将有助于我们理解现代技术中使用的材料，并有助于设计具有技术上有用特性的新材料。这个项目也包含了一个完整的教育部分。特别是在非理工科专业开设现代科学课程，并在学生教育中运用反馈技术

The goal of this Faculty Early Career Development (CAREER) project at Rutgers University is to investigate the effects of intrinsic nanoscale inhomogeneities on the bulk properties of several important oxide systems. These inhomogeneities appear to play a crucial role in the technologically important properties of these materials, such as superconductivity, magnetoresistance, and ferroelectricity. For this purpose, x-ray and neutron scattering techniques will be combined with bulk-property measurements. State of the art scattering techniques, such as resonant x-ray scattering, will be utilized to study the domain structure of the multiphase states, charge and orbital ordering in these states, and the nature of the structural, charge- and orbital fluctuations in the states not exhibiting phase separation. In many cases, simultaneous scattering experiments and in-situ transport measurements will be carried out to characterize metastable states and time- and history-dependent effects. The knowledge gained as the result of this project is expected to facilitate the understanding of correlated oxide materials, as well as to aid in the design of novel materials with technologically useful properties. This project also contains an integrated educational part. In particular, development of the modern science course for non-science majors and the utilization of feedback techniques in student education will be implemented.%%%As the advancement of technology pushes the characteristic device size beyond 100 nm (one hundred-thousandth of an inch), microscopic inhomogeneities begin to play a crucial role in a number of technologically important materials that include silicon-based structures used in computer chips, magnetic memory media, and ferro- and piezoelectrics. Many of these materials belong to the family of the so-called transition-metal oxides with strong correlation effects. Thegoal of this Faculty Early Career Development (CAREER) project at Rutgers University is to investigate the microscopic inhomogeneities and their connection to the physical properties of these materials. For this purpose, state of the art experimental techniques, including x-ray andneutron scattering combined with other experimental techniques will be used. The research will be carried out at the leading national research laboratories, as well as at Rutgers University. The knowledge gained as the result of this project is expected to facilitate our understanding of the materials used in modern technology, as well as to aid in the design of novel materials with technologically useful properties. This project also contains an integrated educational part. In particular, development of the modern science course for non-science majors and the utilization of feedback techniques in student education will be implemented.***