RUI-IMR: Upgrade of a Transmission Electron Microscope for Materials Characterization

该奖项来自材料研究计划仪器，支持佛罗里达国际大学收购激光分子束外延（LMBE）扫描隧道显微镜系统的结构监测系统。PI将构建具有多组分生长能力和原位纳米级表征能力的综合工具。这对于"复杂材料设计生长"的成功至关重要。“原位结构监测系统包括一个新设计的原位反射高能电子衍射（RHEED）仪器，用于实时监测材料生长和低能电子衍射（LEED I-V）光学表面结构测定将是人工结构材料研究的重要组成部分。该系统将被添加到脉冲激光沉积（PLD）系统，形成一个控制生长LMBE设施。该设施将与变温（VT）（25 - 1500K）扫描隧道显微镜（STM）和其他现有的表面表征探针集成，具有超高真空（UHV）集群中的生长能力。其目标是建立一个独特的设施，能够在原位生长和表征材料，用于纳米技术新领域的材料科学家的跨学科研究和教育。 目标是：1）利用材料定制所需的功能，2）探索人工结构材料中的新物理现象，以及3）教育具有科学驱动的纳米制造专业知识的新一代材料科学家。材料研究仪器项目的这一奖项支持佛罗里达国际大学购买激光分子束外延（LMBE）扫描隧道显微镜系统的结构监测系统。PI将构建具有多组分生长能力和原位纳米级表征能力的综合工具。这对于"复杂材料设计生长"的成功至关重要。“原位结构监测系统包括一个新设计的原位反射高能电子衍射仪，用于实时监测材料生长和低能电子衍射光学表面结构测定将是人工结构材料研究的重要组成部分。该系统将被添加到脉冲激光沉积系统上，形成受控生长LMBE设施。该设施将与变温（VT）（25 - 1500K）扫描隧道显微镜和其他现有的表面表征探针集成，具有超高真空集群中的生长能力。其目标是建立一个独特的设施，能够在原位生长和表征材料，用于纳米技术新领域的材料科学家的跨学科研究和教育。 目标是：1）利用材料定制所需的功能，2）探索人工结构材料中的新物理现象，以及3）教育具有科学驱动的纳米制造专业知识的新一代材料科学家。

This award from the Instrumentation for Materials Research program supports Florida International University with the acquisition of a structural monitoring system for a laser- molecular beam epitaxy (LMBE)-scanning tunneling microscope system. The PI's will construct comprehensive tools with multi-component growth capability coupled with in-situ nano-scale characterization capabilities. This is essential for success in "Complex Materials Growth by Design." The in-situ structural monitoring system includes a newly designed in-situ reflection high-energy electron diffraction (RHEED) instrument for real-time monitoring of materials growth and low-energy electron diffraction (LEED I-V) optics for surface structure determination will be the essential component for the studies of artificial structured materials. The system will be added on a pulsed laser deposition (PLD) system, forming a controlled growth LMBE facility. This facility will be integrated with a variable temperature (VT) (25 - 1500K) scanning tunneling microscope (STM) and other existing surface characterization probes with a growth capability in an ultra-high vacuum (UHV) cluster. The objective is to construct a unique facility capable of growing and characterizing materials in-situ for interdisciplinary research and education of materials scientists in the new field of nano-technology. The goal is to: 1) exploit materials tailoring for desired functionalities, 2) explore new physical phenomena in artificially structured materials, and 3) educate a new breed of materials scientists with an expertise in science-driven nano-fabrication. This award from the Instrumentation for Materials Research program supports Florida International University with the acquisition of a structural monitoring system for a laser- molecular beam epitaxy (LMBE)-scanning tunneling microscope system. The PI's will construct comprehensive tools with multi-component growth capability coupled with in-situ nano-scale characterization capabilities. This is essential for success in "Complex Materials Growth by Design." The in-situ structural monitoring system includes a newly designed in-situ reflection high-energy electron diffraction instrument for real-time monitoring of materials growth and low-energy electron diffraction optics for surface structure determination will be the essential component for the studies of artificial structured materials. The system will be added on a pulsed laser deposition system, forming a controlled growth LMBE facility. This facility will be integrated with a variable temperature (VT) (25 - 1500K) scanning tunneling microscope and other existing surface characterization probes with a growth capability in an ultra-high vacuum cluster. The objective is to construct a unique facility capable of growing and characterizing materials in-situ for interdisciplinary research and education of materials scientists in the new field of nano-technology. The goal is to: 1) exploit materials tailoring for desired functionalities, 2) explore new physical phenomena in artificially structured materials, and 3) educate a new breed of materials scientists with an expertise in science-driven nano-fabrication.