Collaborative Research: CRI: IAD: Electronic Testing Education, Research and Training Infrastructure

0708962合作研究：CRI：IAD：电子测试教育，研究和培训架构Vishwani Agrawal这个为期三年的项目将开发数字，存储器，模拟和射频设备的测试能力，未来可能升级到MEMS，光学和纳米技术设备。在该项目下开发的基础设施包括一个测试实验室及其增值应用。新的超大规模集成电路测试实验室将拥有开放式结构的现代化自动测试设备（ATE）。该实验室将设在亚拉巴马的奥本大学，并将通过联网供该州的其他三个机构使用，即位于塔斯卡卢萨的亚拉巴马大学、位于亨茨维尔的亚拉巴马大学和塔斯基吉大学，以促进教育、培训和研究应用。在未来，测试实验室基础设施将允许亚拉巴马以外的大学合作使用，使其成为国家资源。这些应用将包括新的大学课程，包括数字，模拟和射频芯片，FPGA和片上系统设备测试的实践实验;面向行业的培训课程，包括测试实验室练习;以及旨在提高产量和可靠性的硅调试方法研究。以行业为重点的研究和以实践为导向的短期课程预计将使这一基础设施在三年基础设施建设期之后得到行业基金的充分支持。

0708962Collaborative Research: CRI: IAD: Electronic Testing Education, Research and Training InfrastructureVishwani AgrawalThis three-year project will develop capabilities for testing of digital, memory, analog, and radio frequency devices, with possible future upgrades to MEMS, optical and nanotechnology devices. The infrastructure developed under this project consists of a test laboratory and its value-added applications. The new VLSI test laboratory will have modern automatic test equipment (ATE) of open architecture. The laboratory will be located at Auburn University in Alabama and will be used through networked access by three other institutions of that state, namely, University of Alabama at Tuscaloosa, University of Alabama at Huntsville, and Tuskegee University, for advancing education, training and research applications. In the future, the test lab infrastructure will allow collaborative use by universities outside Alabama as well, making it a national resource. The applications will include new university courses with hands-on experiments on testing of digital, analog and radio frequency chips, FPGAs and system-on-a-chip devices; industry-oriented training classes including test lab exercises; and research on silicon debug methods aimed at improving the yield and reliability. Research with industry focus and practice-oriented short courses are expected to make this infrastructure fully supported through industry funds beyond the three-year infrastructure building period.