Tunneling spectroscopy and transport properties of FeSe thin films

FeSe薄膜的隧道光谱和输运特性

• 批准号: 189908852
• 负责人: Professor Dr. Martin Jourdan
• 金额: --
• 依托单位: Institut für Physik
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2011
• 资助国家: 德国
• 起止时间: 2010-12-31 至 2014-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/189908852?language=en
• 关键词: Tunneling; spectroscopy; transport; properties; FeSe

The aim of this project is to gain an improved understanding of the mechanism of superconductivity of ironpnictides/ -chalocogenides and related compounds. We investigate the compound FeSe (and doped FeSe1-xTex), the structurally simplest representative of this class of materials. Epitaxial thin films are used as samples with a defined geometry and well-ordered surface, as necessary or advantageous for the intended investigations.A study of the films thickness and substrate dependence of the superconducting transition temperature focusing on lattice distortions generated by the substrate – thin film interaction (epitaxial stress) will help to improve the understanding of the pronounced preparation condition dependence of the sample properties.We aim at the direct investigation of the superconducting energy gap and the mechanism of superconductivity (strong coupling features) by tunneling spectroscopy on planar junctions. Additionally, by film deposition on substrates with grain boundaries in-plane Josephson junctions for the investigation of the order parameter symmetry can be realised. Supplementary, angular dependent measurements of the upper critical field can provide access to the symmetry of the superconducting order parameter. Hall-effect and Thermopower measurements on FeSe1-xTex thin films give information concerning the doping level dependent Fermi-surfaces.

该项目的目的是获得一个更好的理解的铁pnictides/ -chalocogenides和相关化合物的超导电性的机制。我们调查的化合物FeSe（和掺杂FeSe 1-xTex），这类材料的结构最简单的代表。外延薄膜用作具有限定几何形状和良好有序表面的样品，研究薄膜厚度和衬底对超导转变温度的依赖关系，重点是衬底-薄膜相互作用产生的晶格畸变，（外延应力）将有助于提高对样品性质的明显制备条件依赖性的理解。我们的目的是直接研究样品的性质。超导能隙和超导机制（强耦合特性）的隧道光谱在平面结。此外，通过薄膜沉积在基板上的晶界面内约瑟夫森结的顺序参数对称性的调查可以实现。补充，角度依赖的测量上临界场可以提供访问的超导序参量的对称性。霍尔效应和热电测量FeSe 1-xTex薄膜的掺杂水平依赖费米面的信息。