II-NEW: Infrastructure to Collect and Analyze Circuit Variability in FPGAs

II-新：收集和分析 FPGA 中电路变异性的基础设施

• 批准号: 0855095
• 负责人: Patrick Schaumont
• 金额: $ 11.88万
• 依托单位: Virginia Polytechnic Institute and State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-09-15 至 2013-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0855095&HistoricalAwards=false
• 关键词: II; NEW; Infrastructure; Collect; Analyze

Identical designs of electronic circuits in deep-submicron technology show small parameter variations among different instances implemented on a die or in between dies. The resulting circuit variations have a strong impact on the quality of the design. This project plans to create an infrastructure for characterizing the circuit variability on a large population of Field Programmable Gate Array devices. The proposed infrastructure includes a small population of FPGA kits, as well as a web-based data-collection setup to support variability-experiments on hundreds of FPGAs at the same time, in collaboration with undergraduate students. The project will drive research into innovative applications of circuit variability, in particular into physically unclonable functions (PUF). In addition, a unique education opportunity is created to teach undergraduate students about the impact of variability on their design by making them participate in the experimental data collection. The proposed infrastructure will not only significantly enhance the PI's research in trustworthy circuit design, but also provide valuable variability data for the broader research community.

深亚微米技术中相同的电子电路设计显示，在芯片上或芯片之间实现的不同实例之间的参数变化很小。由此产生的电路变化对设计质量有很大影响。该项目计划创建一个基础设施，用于在大量现场可编程门阵列设备上表征电路的可变性。拟议的基础设施包括少量的现场可编程门阵列套件，以及一个基于网络的数据收集系统，以支持与本科生合作，同时在数百个现场可编程门阵列上进行可变性实验。该项目将推动对电路可变性的创新应用的研究，特别是物理不可克隆功能(PUF)的研究。此外，还创造了一个独特的教育机会，通过让本科生参与实验数据收集，向他们传授变异性对他们设计的影响。拟议的基础设施不仅将显著加强PI在可信电路设计方面的研究，而且还将为更广泛的研究界提供有价值的可变性数据。