MRI-R2: Development of an Integrated STEM Instrument with Nanoscale milli-Electron Volt Energy Loss Spectroscopy
MRI-R2: Development of an Integrated STEM Instrument with Nanoscale milli-Electron Volt Energy Loss Spectroscopy
批准号:
0959905
负责人:
Philip Batson
金额:
$197.29万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2010
资助国家:
美国
项目状态:
已结题
起止时间:
2010-04-15 至 2013-09-30
中文摘要
0959905巴森罗格斯美国新不伦瑞克MRI-R2:开发集成纳米级毫电子伏特能量损失谱的STEM仪器技术摘要:该奖项由2009年美国复苏和再投资法案(公共法律111-5)资助。扫描电子显微镜(STEM)中的电子能量损失谱(EELS)是现代材料开发的基础定量分析技术。罗格斯大学和美国小型企业Nion,Co.的这项合作将使用像差校正方法开发第一台能够达到10 MeV能量分辨率的Angstrom级鳗鱼仪器。利用60-100keV的入射电子能量,可以研究软、硬亚纳米材料的电子、光子和振动行为。该仪器将包括探头侧色像差校正、单色仪-光谱仪能量注册的创新方法、光谱仪前像差校正以及针对高灵敏度和高动态范围进行优化的2D单电子计数检测器。可以解决的问题包括:纳米级物体中的声子和原子/分子振动行为,界面缺陷的电子行为,碳基分子构型变化的能量学,以及纳米级光子场和等离子体场的映射。该仪器将是了解多种材料的结构-功能关系的极佳工具,这些材料对社会应用非常重要,如光伏、储能、催化、高温硬质涂层、纳米电子学、光子学和基于纳米级过程的紧急行为。世界领先的空间和能量分辨率的组合将通过以非常图形化和可视化的方式传达原子水平的功能来激励和培训学生。罗格斯大学多样化的学生群体及其广泛的外展社区都将从这一能力中受益。该用户设施可供大部分科学界使用,将是新泽西州第一个最先进的校正像差EELS/STEM设施,为当地教育和工业用户提供直接访问。非技术概述:该奖项是根据2009年《美国复苏和再投资法案》(公法111-5)资助的。新材料,特别是那些在纳米尺度上开发的材料,提供了必要的关键进展,以满足下一代面临的许多苛刻的社会问题。这种材料的设计需要对原子水平的结构、组成和最精细水平上的成键进行可视化-逐个原子。在过去的50年里,电子显微镜与电子能量损失谱相结合,一直是一种主力,提供纳米尺度的结构和原子组成以及关于原子键的信息。然而,纳米尺度材料科学的最新需求需要更精确和更灵敏的工具。罗格斯大学和美国一家小公司Nion Co.的合作将在电子光谱能力方面产生飞跃,使只包含几个原子的结构的功能得以可视化,甚至到单分子,这是一个到目前为止还无法实现的领域。这种新工具有助于创造高效能源生产和储存所需的新材料、催化、纳米电子学、光子学以及尚未创造的新材料。高度可视化的信息也将在激励学生、培养下一代先进材料科学家和工程师方面发挥重要作用。该仪器将设在罗格斯大学表面改性实验室,并将由先进材料、设备和纳米技术研究所管理。该机构将成为世界领先的机构,为新泽西地区带来促进科学理解、教育推广、产业互动以及与其他国家和国际科学机构合作的新资源。
英文摘要
0959905BatsonRutgers U. New BrunswickMRI-R2: Development of an Integrated STEM Instrument with Nanoscale milli-Electron Volt Energy Loss Spectroscopy Technical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). Electron Energy Loss Spectroscopy (EELS) in the Scanning Transmission Electron Microscope (STEM) is a bedrock quantitative analytical technique for modern materials development. This partnership between Rutgers University and Nion, Co., a small US business, will use aberration correction methods to develop the first Angstrom-level EELS instrument capable of 10 meV energy resolution. Using incident electron energies of 60-100 keV, studies of electronic, photonic and vibronic behavior of soft and hard sub-nanoscale materials will be possible. The instrument will include probe side chromatic aberration correction, an innovative method for monochromator-spectrometer energy registry, pre-spectrometer aberration correction, and a 2D single electron counting detector optimized for high sensitivity and high dynamic range. Accessible problems include: phonon and atomic/molecular vibrational behavior in nanoscale objects, electronic behavior of interfacial defects, energetics of configuration changes in carbon-based molecules, and mapping of nanoscale photonic and plasmonic fields. The instrument will be a superb tool for understanding structure-function relationships in numerous materials of importance to societal applications such as photovoltaics, energy storage, catalysis, high temperature hard coatings, nanoelectronics, photonics, and emergent behavior based on nanoscale processes. The world-leading combination of spatial and energy resolution will be valuable for motivating and training of students by communicating atomic level functionality in very graphic and visual ways. Rutgers diverse student body and its extensive outreach community will both benefit from this capability. This user facility, accessible to a broad portion of the scientific community, will be the first state-of-the-art aberration corrected EELS/STEM facility in New Jersey, providing direct access for both local educational and industrial users. Non-Technical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). New materials, particularly those developed on the nanoscale, provide critical advances required to meet many of the demanding societal problems confronting the next generations. The design of such materials requires visualization of atomic level structure, composition, and bonding at the finest level-atom by atom. For the past 50 years, electron microscopy, combined with electron energy loss spectroscopy, has been a workhorse, providing structure as well as atomic composition on the nanoscale and information on atomic bonding. Nevertheless, the most recent demands of nano-scale materials science require still more precise and sensitive tools. This partnership between Rutgers University and Nion Co., a small US business, will produce a leap ahead in electron spectroscopy capabilities to allow visualization of the function of structures which contain only a few atoms -- even down to single molecules, a region unattainable till now. The new tool aid the creation of new materials required for efficient energy production and storage, catalysis, nanoelectronics, photonics, and new materials yet to be created. The highly visual information will also play a significant role in motivating students, and preparing the future generation of advanced materials scientists and engineers. The instrument will be located at Rutgers University in the Laboratory for Surface Modification and will be administered by the Institute for Advanced Materials, Devices and Nanotechnology. This facility will be a world leader, bringing to the New Jersey region a new resource for the advancement of scientific understanding, for educational outreach, industrial interaction, and collaboration with other national and international scientific institutions.
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