MRI-R2: Development of a System for Real-Time X-Ray Scattering Analysis of Complex Oxide Thin Film Growth

MRI-R2：开发复杂氧化物薄膜生长实时 X 射线散射分析系统

• 批准号: 0959486
• 负责人: Randall Headrick
• 金额: $ 28.72万
• 依托单位: University of Vermont & State Agricultural College
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-03-01 至 2013-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0959486&HistoricalAwards=false
• 关键词: MRI; R2; Development; System; Real

0959486HeadrickU. of Vermont & State Agricultural CollegeTechnical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). X-ray scattering is an enormously powerful tool for the study of materials because of the ability to monitor length scales down to atomic dimensions and penetrating power to reach buried interfaces and structures. Synchrotron-based x-ray techniques also provide time resolution to study thin film crystal growth on time scales relevant to the fundamental surface processes and access to chemical information. This project aims to construct a unique thin-film growth system optimized for epitaxial growth of complex functional oxide materials. The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS) beamline X21, where it will be used to perform in-situ x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to epitaxial film growth kinetics during film growth by Pulsed Laser Deposition or by Sputter Deposition. Research teams from a consortium of institutions, including Boston University, Stony Brook University, the University of Vermont, and Brookhaven National Laboratory will construct and support the facility. These groups bring to bear expertise in a wide variety of oxide materials, including materials that exhibit ferroelectric, ferromagnetic, or antiferromagnetic ordering, and materials with applications in Solid Oxide Fuel Cells. The proposed instrumentation represents an exciting possibility for students to learn from a diverse group of scientists having tremendous expertise in characterization of materials by advanced methods. General users of the NSLS will also have access to the facility, which will ensure that focused high quality research will be performed with the system, while at the same time providing access and support to an international pool of scientists. Layman Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). X-rays are an enormously powerful tool for the study of materials: they can be used to measure structures down to atomic dimensions using diffraction because of their short wavelength, and they can reach inside of materials because they are not strongly absorbed. Synchrotrons are the brightest sources of x-rays routinely available to scientists, which allows time resolved studies of thin film crystal growth on the time scales at or near the time scales of atomic processes taking place on the growth surface. This project aims to construct a unique thin-film growth system optimized for crystal growth of complex oxide thin films that have potential applications in electronics and energy devices. The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS), where it will be used to perform x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to thin film crystal growth during film growth from plumes of atoms created by laser pulses or by energetic ion erosion of a target material. Research teams from a consortium of institutions, including Boston University, Stony Brook University, the University of Vermont, and Brookhaven National Laboratory will construct and support the facility. These groups bring to bear expertise in a wide variety of oxide materials, including materials for future electronic devices that exhibit ferroelectric, ferromagnetic, or antiferromagnetic ordering, and materials with applications in Solid Oxide Fuel Cells. The proposed instrumentation represents an exciting possibility for students to learn from a diverse group of scientists having tremendous expertise in characterization of materials by advanced methods. General users of the NSLS will also have access to the facility, which will ensure that focused high quality research will be performed with the system, while at the same time providing access and support to an international pool of scientists.

0959486HeadrickU.技术摘要：该奖项是根据2009年美国复苏和再投资法案（公法111-5）资助的。X射线散射是研究材料的一个非常强大的工具，因为它能够监测到原子尺度的长度尺度和穿透能力，以达到埋藏的界面和结构。基于同步加速器的X射线技术还提供时间分辨率，以研究与基本表面过程相关的时间尺度上的薄膜晶体生长和化学信息的获取。 本项目旨在构建一个独特的薄膜生长系统，优化复杂功能氧化物材料的外延生长。该系统将与国家同步加速器光源（NSLS）光束线X21的现有基础设施兼容，在那里它将被用来进行表面粗糙化和平滑化，应变，相分离，表面/界面结构，以及其他现象的原位X射线散射研究相关的外延薄膜生长动力学在薄膜生长过程中通过脉冲激光沉积或溅射沉积。 包括波士顿大学、斯托尼布鲁克大学、佛蒙特大学和布鲁克海文国家实验室在内的一个机构联盟的研究小组将建造和支持该设施。 这些小组带来了各种氧化物材料的专业知识，包括表现出铁电，铁磁或反铁磁有序的材料，以及在固体氧化物燃料电池中应用的材料。 拟议的仪器为学生提供了一种令人兴奋的可能性，让他们可以从不同的科学家群体中学习，这些科学家在通过先进方法表征材料方面具有丰富的专业知识。 国家空间定位系统的一般用户也可以使用该设施，这将确保利用该系统进行重点突出的高质量研究，同时为国际科学家人才库提供使用和支持。 该奖项由2009年美国复苏和再投资法案（公法111-5）资助。X射线是研究材料的一种非常强大的工具：由于其波长短，它们可以用于使用衍射测量原子尺寸的结构，并且由于它们没有强烈吸收，它们可以到达材料内部。同步加速器是科学家常规可用的最亮的X射线源，其允许在生长表面上发生的原子过程的时间尺度上或接近时间尺度上对薄膜晶体生长进行时间分辨研究。 该项目旨在构建一种独特的薄膜生长系统，用于在电子和能源设备中具有潜在应用的复杂氧化物薄膜的晶体生长。该系统将与国家同步加速器光源（NSLS）的现有基础设施兼容，在那里它将用于执行表面粗糙化和平滑化，应变，相分离，表面/界面结构以及与薄膜晶体生长相关的其他现象的X射线散射研究，这些现象是在薄膜生长过程中由激光脉冲或高能离子侵蚀靶材料产生的原子羽流产生的。包括波士顿大学、斯托尼布鲁克大学、佛蒙特大学和布鲁克海文国家实验室在内的一个机构联盟的研究小组将建造和支持该设施。 这些小组带来了各种氧化物材料的专业知识，包括未来电子设备的材料，表现出铁电，铁磁或反铁磁有序，以及固体氧化物燃料电池中的应用材料。 拟议的仪器为学生提供了一种令人兴奋的可能性，让他们可以从不同的科学家群体中学习，这些科学家在通过先进方法表征材料方面具有丰富的专业知识。 国家空间定位系统的一般用户也可以使用该设施，这将确保利用该系统进行重点突出的高质量研究，同时为国际科学家人才库提供使用和支持。