MRI-R2: Development of a System for Real-Time X-Ray Scattering Analysis of Complex Oxide Thin Film Growth

MRI-R2：开发复杂氧化物薄膜生长实时 X 射线散射分析系统

• 批准号: 0959486
• 负责人: Randall Headrick
• 金额: $ 28.72万
• 依托单位: University of Vermont & State Agricultural College
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-03-01 至 2013-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0959486&HistoricalAwards=false
• 关键词: MRI; R2; Development; System; Real

0959486HeadrickU. of Vermont & State Agricultural CollegeTechnical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). X-ray scattering is an enormously powerful tool for the study of materials because of the ability to monitor length scales down to atomic dimensions and penetrating power to reach buried interfaces and structures. Synchrotron-based x-ray techniques also provide time resolution to study thin film crystal growth on time scales relevant to the fundamental surface processes and access to chemical information. This project aims to construct a unique thin-film growth system optimized for epitaxial growth of complex functional oxide materials. The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS) beamline X21, where it will be used to perform in-situ x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to epitaxial film growth kinetics during film growth by Pulsed Laser Deposition or by Sputter Deposition. Research teams from a consortium of institutions, including Boston University, Stony Brook University, the University of Vermont, and Brookhaven National Laboratory will construct and support the facility. These groups bring to bear expertise in a wide variety of oxide materials, including materials that exhibit ferroelectric, ferromagnetic, or antiferromagnetic ordering, and materials with applications in Solid Oxide Fuel Cells. The proposed instrumentation represents an exciting possibility for students to learn from a diverse group of scientists having tremendous expertise in characterization of materials by advanced methods. General users of the NSLS will also have access to the facility, which will ensure that focused high quality research will be performed with the system, while at the same time providing access and support to an international pool of scientists. Layman Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). X-rays are an enormously powerful tool for the study of materials: they can be used to measure structures down to atomic dimensions using diffraction because of their short wavelength, and they can reach inside of materials because they are not strongly absorbed. Synchrotrons are the brightest sources of x-rays routinely available to scientists, which allows time resolved studies of thin film crystal growth on the time scales at or near the time scales of atomic processes taking place on the growth surface. This project aims to construct a unique thin-film growth system optimized for crystal growth of complex oxide thin films that have potential applications in electronics and energy devices. The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS), where it will be used to perform x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to thin film crystal growth during film growth from plumes of atoms created by laser pulses or by energetic ion erosion of a target material. Research teams from a consortium of institutions, including Boston University, Stony Brook University, the University of Vermont, and Brookhaven National Laboratory will construct and support the facility. These groups bring to bear expertise in a wide variety of oxide materials, including materials for future electronic devices that exhibit ferroelectric, ferromagnetic, or antiferromagnetic ordering, and materials with applications in Solid Oxide Fuel Cells. The proposed instrumentation represents an exciting possibility for students to learn from a diverse group of scientists having tremendous expertise in characterization of materials by advanced methods. General users of the NSLS will also have access to the facility, which will ensure that focused high quality research will be performed with the system, while at the same time providing access and support to an international pool of scientists.

0959486海德里克大学。佛蒙特州州立农业学院技术摘要：该奖项根据 2009 年美国复苏和再投资法案（公法 111-5）提供资金。 X 射线散射是材料研究的一种非常强大的工具，因为它能够监测小至原子尺寸的长度，并具有到达埋藏界面和结构的穿透力。基于同步加速器的 X 射线技术还提供时间分辨率，以研究与基本表面过程相关的时间尺度上的薄膜晶体生长和获取化学信息。 该项目旨在构建一种独特的薄膜生长系统，针对复杂功能氧化物材料的外延生长进行优化。该系统将与国家同步加速器光源 (NSLS) 光束线 X21 的现有基础设施兼容，用于对表面粗糙化和平滑化、应变、相分离、表面/界面结构以及脉冲激光沉积或溅射沉积薄膜生长过程中与外延薄膜生长动力学相关的其他现象进行原位 X 射线散射研究。 来自波士顿大学、石溪大学、佛蒙特大学和布鲁克海文国家实验室等机构联盟的研究团队将建设和支持该设施。 这些小组拥有各种氧化物材料的专业知识，包括表现出铁电、铁磁或反铁磁有序的材料，以及在固体氧化物燃料电池中应用的材料。 所提出的仪器为学生提供了一种令人兴奋的可能性，可以向不同的科学家群体学习，这些科学家在通过先进方法表征材料方面拥有丰富的专业知识。 NSLS 的普通用户也可以使用该设施，这将确保使用该系统进行集中的高质量研究，同时为国际科学家库提供访问和支持。 外行摘要：该奖项根据 2009 年美国复苏和再投资法案（公法 111-5）提供资金。 X 射线是研究材料的极其强大的工具：由于其波长短，因此可用于利用衍射来测量小至原子尺寸的结构，并且由于吸收不强烈，因此可以到达材料内部。同步加速器是科学家常用的最亮的 X 射线源，它允许在等于或接近生长表面上发生的原子过程的时间尺度上对薄膜晶体生长进行时间分辨研究。 该项目旨在构建一种独特的薄膜生长系统，针对复杂氧化物薄膜的晶体生长进行优化，该薄膜在电子和能源设备中具有潜在的应用。该系统将与国家同步加速器光源（NSLS）的现有基础设施兼容，用于对表面粗糙化和平滑化、应变、相分离、表面/界面结构以及与激光脉冲或目标材料的高能离子侵蚀产生的原子羽流进行薄膜生长过程中薄膜晶体生长相关的其他现象进行X射线散射研究。来自波士顿大学、石溪大学、佛蒙特大学和布鲁克海文国家实验室等机构联盟的研究团队将建设和支持该设施。 这些小组拥有各种氧化物材料的专业知识，包括用于未来电子设备的具有铁电、铁磁或反铁磁有序性的材料，以及在固体氧化物燃料电池中应用的材料。 所提出的仪器为学生提供了一种令人兴奋的可能性，可以向不同的科学家群体学习，这些科学家在通过先进方法表征材料方面拥有丰富的专业知识。 NSLS 的普通用户也可以使用该设施，这将确保使用该系统进行集中的高质量研究，同时为国际科学家库提供访问和支持。