MRI-R2: Development of a System for Real-Time X-Ray Scattering Analysis of Complex Oxide Thin Film Growth

MRI-R2：开发复杂氧化物薄膜生长实时 X 射线散射分析系统

• 批准号: 0959486
• 负责人: Randall Headrick
• 金额: $ 28.72万
• 依托单位: University of Vermont & State Agricultural College
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-03-01 至 2013-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0959486&HistoricalAwards=false
• 关键词: MRI; R2; Development; System; Real

0959486HeadrickU. of Vermont & State Agricultural CollegeTechnical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). X-ray scattering is an enormously powerful tool for the study of materials because of the ability to monitor length scales down to atomic dimensions and penetrating power to reach buried interfaces and structures. Synchrotron-based x-ray techniques also provide time resolution to study thin film crystal growth on time scales relevant to the fundamental surface processes and access to chemical information. This project aims to construct a unique thin-film growth system optimized for epitaxial growth of complex functional oxide materials. The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS) beamline X21, where it will be used to perform in-situ x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to epitaxial film growth kinetics during film growth by Pulsed Laser Deposition or by Sputter Deposition. Research teams from a consortium of institutions, including Boston University, Stony Brook University, the University of Vermont, and Brookhaven National Laboratory will construct and support the facility. These groups bring to bear expertise in a wide variety of oxide materials, including materials that exhibit ferroelectric, ferromagnetic, or antiferromagnetic ordering, and materials with applications in Solid Oxide Fuel Cells. The proposed instrumentation represents an exciting possibility for students to learn from a diverse group of scientists having tremendous expertise in characterization of materials by advanced methods. General users of the NSLS will also have access to the facility, which will ensure that focused high quality research will be performed with the system, while at the same time providing access and support to an international pool of scientists. Layman Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). X-rays are an enormously powerful tool for the study of materials: they can be used to measure structures down to atomic dimensions using diffraction because of their short wavelength, and they can reach inside of materials because they are not strongly absorbed. Synchrotrons are the brightest sources of x-rays routinely available to scientists, which allows time resolved studies of thin film crystal growth on the time scales at or near the time scales of atomic processes taking place on the growth surface. This project aims to construct a unique thin-film growth system optimized for crystal growth of complex oxide thin films that have potential applications in electronics and energy devices. The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS), where it will be used to perform x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to thin film crystal growth during film growth from plumes of atoms created by laser pulses or by energetic ion erosion of a target material. Research teams from a consortium of institutions, including Boston University, Stony Brook University, the University of Vermont, and Brookhaven National Laboratory will construct and support the facility. These groups bring to bear expertise in a wide variety of oxide materials, including materials for future electronic devices that exhibit ferroelectric, ferromagnetic, or antiferromagnetic ordering, and materials with applications in Solid Oxide Fuel Cells. The proposed instrumentation represents an exciting possibility for students to learn from a diverse group of scientists having tremendous expertise in characterization of materials by advanced methods. General users of the NSLS will also have access to the facility, which will ensure that focused high quality research will be performed with the system, while at the same time providing access and support to an international pool of scientists.

0959486 headricku。技术摘要：该奖项是根据2009年美国复苏和再投资法案（公法111-5）资助的。x射线散射是研究材料的一种非常有力的工具，因为它能够监测长度缩小到原子尺寸，并具有穿透能力，可以到达埋藏的界面和结构。基于同步加速器的x射线技术还提供了时间分辨率，可以在与基本表面过程相关的时间尺度上研究薄膜晶体生长，并获得化学信息。本项目旨在构建一个独特的薄膜生长系统，优化复杂功能氧化物材料的外延生长。该系统将与国家同步加速器光源（NSLS）光束线X21的现有基础设施兼容，在那里它将用于进行表面粗糙和平滑、应变、相分离、表面/界面结构以及其他与脉冲激光沉积或溅射沉积过程中外延膜生长动力学相关的现象的原位x射线散射研究。来自波士顿大学、石溪大学、佛蒙特大学和布鲁克海文国家实验室等机构的研究团队将建设和支持该设施。这些团队在各种氧化物材料方面拥有专业知识，包括表现出铁电、铁磁或反铁磁有序的材料，以及在固体氧化物燃料电池中的应用材料。提出的仪器代表了一个令人兴奋的可能性，学生们可以从不同的科学家群体中学习，他们在用先进的方法表征材料方面拥有丰富的专业知识。NSLS的一般用户也可以使用该设施，这将确保使用该系统进行集中的高质量研究，同时为国际科学家库提供访问和支持。概要：本奖项是根据2009年美国复苏和再投资法案（公法111-5）资助的。x射线是研究材料的一种非常强大的工具：由于其波长短，可以利用衍射来测量小到原子尺寸的结构，并且由于其不被强烈吸收，可以到达材料内部。同步加速器是科学家们常用的最亮的x射线源，它允许在生长表面发生的原子过程的时间尺度上或接近时间尺度上对薄膜晶体生长进行时间分辨研究。本项目旨在构建一种独特的薄膜生长系统，该系统针对复杂氧化物薄膜的晶体生长进行优化，在电子和能源器件中具有潜在的应用前景。该系统将与国家同步加速器光源（NSLS）的现有基础设施兼容，在那里它将用于进行x射线散射研究，研究表面粗糙和平滑、应变、相分离、表面/界面结构，以及在激光脉冲或目标材料的高能离子侵蚀产生的原子羽状生长过程中与薄膜晶体生长有关的其他现象。来自波士顿大学、石溪大学、佛蒙特大学和布鲁克海文国家实验室等机构的研究团队将建设和支持该设施。这些团队在各种各样的氧化物材料方面拥有专业知识，包括未来电子设备中表现出铁电、铁磁或反铁磁有序的材料，以及固体氧化物燃料电池中的应用材料。提出的仪器代表了一个令人兴奋的可能性，学生们可以从不同的科学家群体中学习，他们在用先进的方法表征材料方面拥有丰富的专业知识。NSLS的一般用户也可以使用该设施，这将确保使用该系统进行集中的高质量研究，同时为国际科学家库提供访问和支持。