MRI-R2: Development of a System for Real-Time X-Ray Scattering Analysis of Complex Oxide Thin Film Growth

MRI-R2：开发复杂氧化物薄膜生长实时 X 射线散射分析系统

• 批准号: 0959486
• 负责人: Randall Headrick
• 金额: $ 28.72万
• 依托单位: University of Vermont & State Agricultural College
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-03-01 至 2013-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0959486&HistoricalAwards=false
• 关键词: MRI; R2; Development; System; Real

0959486HeadrickU. of Vermont & State Agricultural CollegeTechnical Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). X-ray scattering is an enormously powerful tool for the study of materials because of the ability to monitor length scales down to atomic dimensions and penetrating power to reach buried interfaces and structures. Synchrotron-based x-ray techniques also provide time resolution to study thin film crystal growth on time scales relevant to the fundamental surface processes and access to chemical information. This project aims to construct a unique thin-film growth system optimized for epitaxial growth of complex functional oxide materials. The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS) beamline X21, where it will be used to perform in-situ x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to epitaxial film growth kinetics during film growth by Pulsed Laser Deposition or by Sputter Deposition. Research teams from a consortium of institutions, including Boston University, Stony Brook University, the University of Vermont, and Brookhaven National Laboratory will construct and support the facility. These groups bring to bear expertise in a wide variety of oxide materials, including materials that exhibit ferroelectric, ferromagnetic, or antiferromagnetic ordering, and materials with applications in Solid Oxide Fuel Cells. The proposed instrumentation represents an exciting possibility for students to learn from a diverse group of scientists having tremendous expertise in characterization of materials by advanced methods. General users of the NSLS will also have access to the facility, which will ensure that focused high quality research will be performed with the system, while at the same time providing access and support to an international pool of scientists. Layman Summary: This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5). X-rays are an enormously powerful tool for the study of materials: they can be used to measure structures down to atomic dimensions using diffraction because of their short wavelength, and they can reach inside of materials because they are not strongly absorbed. Synchrotrons are the brightest sources of x-rays routinely available to scientists, which allows time resolved studies of thin film crystal growth on the time scales at or near the time scales of atomic processes taking place on the growth surface. This project aims to construct a unique thin-film growth system optimized for crystal growth of complex oxide thin films that have potential applications in electronics and energy devices. The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS), where it will be used to perform x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to thin film crystal growth during film growth from plumes of atoms created by laser pulses or by energetic ion erosion of a target material. Research teams from a consortium of institutions, including Boston University, Stony Brook University, the University of Vermont, and Brookhaven National Laboratory will construct and support the facility. These groups bring to bear expertise in a wide variety of oxide materials, including materials for future electronic devices that exhibit ferroelectric, ferromagnetic, or antiferromagnetic ordering, and materials with applications in Solid Oxide Fuel Cells. The proposed instrumentation represents an exciting possibility for students to learn from a diverse group of scientists having tremendous expertise in characterization of materials by advanced methods. General users of the NSLS will also have access to the facility, which will ensure that focused high quality research will be performed with the system, while at the same time providing access and support to an international pool of scientists.

0959486headricku。佛蒙特州和州农业大学摘要：该奖项是根据2009年《美国复苏与再投资法》（公法111-5）资助的。 X射线散射是研究材料的非常强大的工具，因为能够监视长度缩放到原子尺寸并穿透力量到达埋藏的界面和结构。基于同步加速器的X射线技术还提供时间分辨率，以研究与基本表面过程和获取化学信息有关的时间尺度研究薄膜晶体生长。 该项目旨在构建一种优化的独特的薄膜增长系统，以优化用于复杂功能氧化物材料的外延生长。该系统将与国家同步器光源（NSLS）光束线X21的现有基础架构兼容，在该基础架构中，它将用于对表面粗糙和平滑，相结合，相位分离，表面/界面结构以及其他与外生膜成长Kinetics相关的现象的表面粗糙和平滑，相位分离，表面/界面结构以及由Puls puls pulsed deptosition deptosition deptosition进行表面粗糙和平滑，相位分离，表面/界面结构以及其他现象的现场X射线散射研究。 来自波士顿大学，斯托尼·布鲁克大学，佛蒙特大学和布鲁克黑文国家实验室等机构联盟的研究团队将建设和支持该设施。 这些组具有多种氧化物材料的专业知识，包括表现出铁电，铁磁或抗磁磁有序的材料，以及在固体氧化物燃料电池中应用的材料。 拟议的仪器代表了学生向一群具有高级方法表征材料表征巨大专业知识的科学家群体学习的令人兴奋的可能性。 NSLS的普通用户也将可以访问该设施，这将确保专注的高质量研究将对系统进行，同时为国际科学家提供访问和支持。 外行摘要：该奖项是根据2009年《美国复苏与再投资法》（公法111-5）资助的。 X射线是一种非常强大的材料研究工具：由于其短波长，它们可用于使用衍射来测量结构到原子尺寸，并且由于它们没有被强烈吸收，因此它们可以到达材料内部。同步性是科学家通常可用的X射线的最亮来源，它允许在生长表面上发生的原子过程的时间尺度或附近对薄膜晶体生长的时间分解研究。 该项目旨在构建一个优化的独特的薄膜增长系统，以优化用于在电子和能量设备中具有潜在应用的复杂氧化物薄膜的晶体生长。 The system will be compatible with the existing infrastructure at the National Synchrotron Light Source (NSLS), where it will be used to perform x-ray scattering studies of surface roughening and smoothening, strain, phase separation, surface/interface structure, and other phenomena related to thin film crystal growth during film growth from plumes of atoms created by laser pulses or by energetic ion erosion of a target material.来自波士顿大学，斯托尼·布鲁克大学，佛蒙特大学和布鲁克黑文国家实验室等机构联盟的研究团队将建设和支持该设施。 这些组带来了多种氧化物材料的专业知识，包括用于表现出铁电，铁磁或抗磁磁性的未来电子设备的材料，以及在固体氧化物燃料电池中应用的材料。 拟议的仪器代表了学生向一群具有高级方法表征材料表征巨大专业知识的科学家群体学习的令人兴奋的可能性。 NSLS的普通用户也将可以访问该设施，这将确保专注的高质量研究将对系统进行，同时为国际科学家提供访问和支持。