SBIR Phase I: Manufacturing Electronic Health Monitoring (MEHM) System

SBIR 第一阶段：制造电子健康监控 (MEHM) 系统

• 批准号: 1014059
• 负责人: Brandon Parks
• 金额: $ 15万
• 依托单位: Nokomis, Inc.
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-07-01 至 2010-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1014059&HistoricalAwards=false
• 关键词: SBIR; Phase; Manufacturing; Electronic; Health

This Small Business Innovation Research (SBIR) Phase I project aims to develop an innovative method to increase manufacturing efficiency and cut production costs. Low-cost and small electronic components can bring large and expensive systems to a crashing halt when they fail without warning or notice. Manufacturing plants are an important user of electronic devices, requiring assurance of critical system functionality and key electronic devices. Current mitigation techniques rely on early replacement of critical devices, a limited and expensive methodology that drastically increases costs and downtime. Building upon years of magnetic interference (EMI) analysis, this project will develop a system to predict electronic problems, providing the opportunity for scheduled maintenance and equipment repair before failure. This system leverages the emitted electromagnetic spectra of electrical components to identify deterioration and degraded functionality as the device ages. Testing has identified fault indicators in a select number of electronic devices. This Phase I project will focus upon finding the spectral characteristics that indicate impending failures of multiple targets suitable for a manufacturing environment. Upon completion, the project will have a signature list of failure prediction indicators to create an automated Manufacturing Electronic Health Monitoring (MEHM) system.The broader impact/commercial potential of this project is direct maintenance and quality improvements for manufacturing systems, saving resources and improving profits. Building upon years of EMI analysis, this project will develop a Manufacturing Electronic Health Monitoring (MEHM) system to predict electronic problems before failure to the benefit of numerous customers. An early warning system for component failure will provide maintenance personnel the ability to both replace identified electronics within scheduled downtime prior to system failure and forgo maintenance on healthy sub-systems. American manufacturing companies have always innovated, maximizing capabilities, efficiency, safety, and performance. The MEHM system is the next step in achieving a realizable advantage to any manufacturing company. As any manufacturer employing electronics can use this system, the market potential is vast.

这个小企业创新研究（SBIR）第一阶段项目旨在开发一种创新方法来提高制造效率并降低生产成本。低成本和小型电子元件可以使大型和昂贵的系统在没有警告或通知的情况下发生故障时崩溃。制造工厂是电子设备的重要用户，需要保证关键系统功能和关键电子设备。目前的缓解技术依赖于早期更换关键设备，这是一种有限且昂贵的方法，大大增加了成本和停机时间。在多年的电磁干扰（EMI）分析的基础上，该项目将开发一个系统来预测电子问题，为故障前的定期维护和设备维修提供机会。该系统利用电子组件的发射电磁频谱来识别设备老化时的劣化和退化功能。测试已经在选定数量的电子设备中发现了故障指示器。这个第一阶段项目将集中在寻找光谱特性，表明即将发生故障的多个目标适用于制造环境。完成后，该项目将有一个故障预测指标的签名列表，以创建一个自动化的制造电子健康监测（MEHM）系统。该项目的更广泛的影响/商业潜力是直接维护和质量改进制造系统，节省资源和提高利润。在多年EMI分析的基础上，该项目将开发一个制造电子健康监测（MEHM）系统，以预测故障前的电子问题，使众多客户受益。部件故障的早期预警系统将使维护人员能够在系统故障之前的预定停机时间内更换已识别的电子设备，并放弃对健康子系统的维护。美国制造企业一直在创新，最大限度地提高能力，效率，安全和性能。MEHM系统是任何制造公司实现可实现优势的下一步。由于任何使用电子产品的制造商都可以使用该系统，因此市场潜力巨大。