MRI: Acquisition of a scanning X-ray Photoelectron Spectrometer with Ultraviolet Photon Source and C60 Ion Gun

MRI：配备紫外光子源和 C60 离子枪的扫描 X 射线光电子能谱仪

• 批准号: 1126115
• 负责人: Jiangeng Xue
• 金额: $ 62.8万
• 依托单位: University of Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2011
• 资助国家: 美国
• 起止时间: 2011-10-01 至 2014-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1126115&HistoricalAwards=false
• 关键词: MRI; Acquisition; scanning; ray; Photoelectron

Technical Summary:X-ray and ultraviolet photoelectron spectroscopies (XPS and UPS, respectively) provide information on chemical composition, chemical states, and electronic properties of surfaces and interfaces, which are critical to assist the understanding and further development of materials for a broad range of applications. The UPS capability coupled with the C60 ion sputtering source further expands the instrumentation capability to 'soft materials' such as organic, polymeric, and biological materials, which have received great scientific interests in recent decades. Examples of current NSF sponsored projects at the University of Florida that will greatly benefit from this instrument include: (1) characterization of organic-based semiconductors and interfaces for electronic and optoelectronic applications; (2) surfaces and interfaces of metal phosphonate and cyanometallate materials; (3) molecular approaches to directional growth of nanostructures for nanoelectronics; (4) microstructure-informed design methodology for advanced magnesium alloys; (5) graphene and other carbon-based materials and interfaces; (6) self-assembled colloidal nanoparticles for magnetic/biosensing applications. The Major Analytical Instrumentation Center (MAIC) is a user facility providing analytical microscopy and spectrometry instrumentation support to all disciplines at the university and the surrounding community. The state-of-the-art XPS/UPS instrument requested in this proposal replaces a 25-year-old XPS system, which not only accelerates the progress in various research programs through the vastly increased efficiency, but also provides new information through spatial imaging, high resolution chemical profiling, and vast expansion of the realm of materials to be characterized. The broader impacts of this instrumentation are also realized through a number of educational and outreach activities at the University of Florida and beyond.Non-Technical Summary: The advancement of many modern technologies, such as various energy solutions (storage, conversion, and conservation), nanotechnology, electronics and photonics, biomaterials and biotechnology, and transportation, rests upon the fundamental understanding of surfaces of the relevant materials and/or interfaces between different material components. One of the most informative surface analytical techniques is the x-ray or ultraviolet photoelectron spectroscopy (XPS and UPS, respectively), in which an x-ray or ultraviolet light is shone on the targeted materials and the types of atoms and the local chemical environment and physical properties of these atoms in the material near the surface are revealed by analyzing the energy of electrons ejected from the material surface. Buried material interfaces can also be probed when combining XPS/UPS with appropriate material deposition or removal techniques. The state-of-the-art XPS/UPS instrument requested in this proposal replaces a 25-year-old XPS system at the Major Analytical Instrumentation Center (MAIC), a user facility at the University of Florida which hosts an array of analytical instrumentation for the study of various types of materials. The new instrument provides vastly increased efficiency, new information through spatial imaging, higher energy resolution, and vast expansion of the realm of materials to be characterized. Furthermore, the new instrument provides unique opportunities for the cross-disciplinary research training and education of many graduate and undergraduate students, as well as opportunities for outreach to K-12 students and teachers and the general science and engineering community.

技术概述：X射线和紫外光电子能谱(分别为XPS和UPS)提供了表面和界面的化学成分、化学状态和电子性质的信息，这对于帮助理解和进一步开发广泛应用的材料至关重要。UPS的能力与C60离子溅射源相结合，进一步将仪器能力扩展到有机、聚合物和生物材料等软材料，这些材料在近几十年来受到了极大的科学兴趣。目前由美国国家科学基金会赞助的佛罗里达大学项目将大大受益于该仪器的例子包括：(1)用于电子和光电应用的有机半导体和界面的表征；(2)用于金属磷酸盐和氰基金属酸盐材料的表面和界面的表征；(3)用于纳米电子设备的纳米结构的定向生长的分子方法；(4)先进镁合金的微结构信息设计方法；(5)石墨烯和其他碳基材料和界面的设计方法；(6)用于磁/生物传感应用的自组装胶体纳米颗粒。主要分析仪器中心(MAIC)是一个用户设施，为大学和周围社区的所有学科提供分析显微镜和光谱仪器支持。本提案中要求的最先进的XPS/UPS仪器取代了已有25年历史的XPS系统，该系统不仅通过极大地提高效率加快了各种研究计划的进展，而且通过空间成像、高分辨率化学剖面图以及待表征材料领域的巨大扩展提供了新的信息。非技术总结：许多现代技术的进步，例如各种能源解决方案(储存、转换和节约)、纳米技术、电子学和光子学、生物材料和生物技术以及交通运输，取决于对相关材料表面和/或不同材料成分之间的界面的基本了解。信息最丰富的表面分析技术之一是X射线或紫外光电子能谱(分别为XPS和UPS)，即X射线或紫外光照射到目标材料上，通过分析从材料表面射出的电子的能量，揭示原子的类型以及这些原子在材料表面附近的局部化学环境和物理性质。当XPS/UPS与适当的材料沉积或去除技术相结合时，也可以探测埋藏的材料界面。本提案中要求的最先进的XPS/UPS仪器取代了主要分析仪器中心(MAIC)已有25年历史的XPS系统，该中心是佛罗里达大学的用户设施，拥有一系列分析仪器，用于研究各种类型的材料。新仪器大大提高了效率，通过空间成像提供了新的信息，更高的能量分辨率，并极大地扩展了待表征的材料领域。此外，新的文书为许多研究生和本科生的跨学科研究培训和教育提供了独特的机会，并提供了接触K-12学生和教师以及普通科学和工程界的机会。