MRI: Acquisition of a scanning X-ray Photoelectron Spectrometer with Ultraviolet Photon Source and C60 Ion Gun

技术概述：X射线和紫外光电子能谱（分别为XPS和UPS）提供了有关表面和界面的化学组成、化学状态和电子特性的信息，这对于帮助理解和进一步开发广泛应用的材料至关重要。 UPS的能力加上C60离子溅射源进一步扩展了仪器的能力，如有机，聚合物和生物材料，这些材料在最近几十年受到了极大的科学兴趣。美国国家科学基金会目前在佛罗里达大学赞助的项目的例子将大大受益于这一仪器包括：（1）表征有机基半导体和界面的电子和光电子应用;（2）表面和界面的金属膦酸盐和氰金属酸盐材料;（3）分子的方法，定向生长的纳米结构的纳米电子学;（4）先进镁合金的微观结构设计方法;（5）石墨烯和其他碳基材料和界面;（6）用于磁/生物传感应用的自组装胶体纳米颗粒。主要分析仪器中心（MAIC）是一个用户设施，为大学和周围社区的所有学科提供分析显微镜和光谱仪器支持。该提案中要求的最先进的XPS/UPS仪器取代了已有25年历史的XPS系统，该系统不仅通过大幅提高效率加速了各种研究计划的进展，而且还通过空间成像，高分辨率化学分析和待表征材料领域的广泛扩展提供了新的信息。通过在佛罗里达大学和其他地方开展的一系列教育和推广活动，也实现了这一工具的更广泛影响。非技术性总结：许多现代技术的进步，例如各种能源解决方案（储存、转换和保存）、纳米技术、电子学和光子学、生物材料和生物技术以及运输，取决于对相关材料的表面和/或不同材料组分之间的界面的基本理解。 最具信息量的表面分析技术之一是X射线或紫外光电子能谱（分别为XPS和UPS），其中X射线或紫外光照射在目标材料上，通过分析从材料表面发射的电子的能量，揭示表面附近材料中原子的类型以及这些原子的局部化学环境和物理性质。 当将XPS/UPS与适当的材料沉积或去除技术相结合时，也可以探测埋入的材料界面。 本提案中要求的最先进的XPS/UPS仪器取代了佛罗里达大学用户设施主要分析仪器中心（MAIC）已有25年历史的XPS系统，该中心拥有一系列分析仪器，用于研究各种类型的材料。新仪器提供了大大提高的效率，通过空间成像，更高的能量分辨率和材料领域的广泛扩展的新信息。此外，新仪器为许多研究生和本科生的跨学科研究培训和教育提供了独特的机会，并为K-12学生和教师以及一般科学和工程界提供了机会。

Technical Summary:X-ray and ultraviolet photoelectron spectroscopies (XPS and UPS, respectively) provide information on chemical composition, chemical states, and electronic properties of surfaces and interfaces, which are critical to assist the understanding and further development of materials for a broad range of applications. The UPS capability coupled with the C60 ion sputtering source further expands the instrumentation capability to 'soft materials' such as organic, polymeric, and biological materials, which have received great scientific interests in recent decades. Examples of current NSF sponsored projects at the University of Florida that will greatly benefit from this instrument include: (1) characterization of organic-based semiconductors and interfaces for electronic and optoelectronic applications; (2) surfaces and interfaces of metal phosphonate and cyanometallate materials; (3) molecular approaches to directional growth of nanostructures for nanoelectronics; (4) microstructure-informed design methodology for advanced magnesium alloys; (5) graphene and other carbon-based materials and interfaces; (6) self-assembled colloidal nanoparticles for magnetic/biosensing applications. The Major Analytical Instrumentation Center (MAIC) is a user facility providing analytical microscopy and spectrometry instrumentation support to all disciplines at the university and the surrounding community. The state-of-the-art XPS/UPS instrument requested in this proposal replaces a 25-year-old XPS system, which not only accelerates the progress in various research programs through the vastly increased efficiency, but also provides new information through spatial imaging, high resolution chemical profiling, and vast expansion of the realm of materials to be characterized. The broader impacts of this instrumentation are also realized through a number of educational and outreach activities at the University of Florida and beyond.Non-Technical Summary: The advancement of many modern technologies, such as various energy solutions (storage, conversion, and conservation), nanotechnology, electronics and photonics, biomaterials and biotechnology, and transportation, rests upon the fundamental understanding of surfaces of the relevant materials and/or interfaces between different material components. One of the most informative surface analytical techniques is the x-ray or ultraviolet photoelectron spectroscopy (XPS and UPS, respectively), in which an x-ray or ultraviolet light is shone on the targeted materials and the types of atoms and the local chemical environment and physical properties of these atoms in the material near the surface are revealed by analyzing the energy of electrons ejected from the material surface. Buried material interfaces can also be probed when combining XPS/UPS with appropriate material deposition or removal techniques. The state-of-the-art XPS/UPS instrument requested in this proposal replaces a 25-year-old XPS system at the Major Analytical Instrumentation Center (MAIC), a user facility at the University of Florida which hosts an array of analytical instrumentation for the study of various types of materials. The new instrument provides vastly increased efficiency, new information through spatial imaging, higher energy resolution, and vast expansion of the realm of materials to be characterized. Furthermore, the new instrument provides unique opportunities for the cross-disciplinary research training and education of many graduate and undergraduate students, as well as opportunities for outreach to K-12 students and teachers and the general science and engineering community.