HIOS structure and morphology characterization (Z02)

该中心项目通过各种基于电子束的技术提供表征服务，获得有关CRC内产生的混合无机/有机系统（HIOS）的原子和电子结构的信息。利用科学设备，其中一些是最近才购买或在化学研究中心第二个资助期内建造的，将应用范围广泛的电子成像、衍射和光谱技术，涵盖范围非常广泛的电子束能量（5千伏至200千伏）。这包括以原子分辨率成像和绘制组成，在电子束能量低至5 keV时绘制局部晶体结构和束敏感HIOS取向，等离子体本征模的绘制，电子束光刻，以及许多其他可用于扫描电子显微镜或（扫描）透射电子显微镜的技术。

This central project provides characterization services by various electron beam based techniques, obtaining information about atomic and electronic structure on hybrid inorganic/organic systems (HIOS) produced within the CRC. Using scientific equipment some of which has only very recently been purchased or built during the second funding period of the CRC a wide range of electron imaging, diffraction and spectroscopy techniques covering a very wide range of electron beam energies (5 kV – 200 kV) will be applied. This includes imaging and mapping of composition at atomic resolution, mapping of local crystal structure and orientation of beam-sensitive HIOS at electron beam energies down to 5 keV, mapping of plasmonic eigenmodes, electron-beam lithography, as well as many other techniques available to scanning electron microscopy, or (scanning) transmission electron microscopy.