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Inducing multiferroicity in EuO thin films by epitaxial strain

Inducing multiferroicity in EuO thin films by epitaxial strain
通过外延应变诱导 EuO 薄膜的多铁性
批准号:
209337535
负责人:
Dr. Rainer Held
金额:
$0.0万
依托单位:
依托单位国家:
德国
项目类别:
Research Fellowships
财政年份:
2012
资助国家:
德国
项目状态:
已结题
起止时间:
2011-12-31 至 2013-12-31

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中文摘要
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英文摘要
For more than fifty years, device speeds and storage capacities in microelectronics have doubled approximately every two years. Continuation of this advancement, however, has become more and more difficult. The problems of heat generation and fundamental quantum mechanical limitations ultimately require a radical change in microelectronic technology. One of the promising innovations to conventional technology is spintronics, the use of the electron spin degree of freedom in solid-state systems. Spin-transistors potentially offer high processing speeds with reduced heat dissipation and inherently possess non-volatile memory. Therefore, in the long run, they could become candidates to replace conventional transistors. For the development of these devices, materials allowing for the effective injection of spin-polarized currents into semiconductors and switching their magnetization at room-temperature by applying electric fields (multiferroics) could be of high importance.Therefore, I propose a research program to investigate experimentally whether the promising material europium monoxide can be transformed into a novel state using epitaxial strain, rendering this highly spin-polarized ferromagnetic semiconductor also multiferroic. The epitaxial strain is additionally expected to enhance the Curie temperature of EuO providing a possible route to higher-temperature multiferroics. Furthermore, possibilities to epitaxially integrate strained EuO films in silicon shall be investigated. The proposed research program is not only of interest for spintronic applications, but could also contribute to a better fundamental understanding of epitaxial strain effects in EuO. The project employs advanced molecular beam epitaxy and in-situ monitoring techniques. Most importantly, this includes film growth with atomic layer precision, angle-resolved photoemission spectroscopy and utilization of specific, commercially not available substrate materials.
期刊论文(1)
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DOI: 10.1063/1.4867161
发表时间: 2014-03-03
期刊: APPLIED PHYSICS LETTERS
影响因子: 4
作者: [Mundy, Julia A., Hodash, Daniel, Schlom, Darrell G.]
通讯作者: Schlom, Darrell G.
海外基金