CDS&E: Scanning Electrochemical Microscopy with Compressed Sensing: Beyond the Point Probe

该项目由化学部的化学测量和成像计划资助。哥伦比亚大学的Daniel Esposito教授和John Wright教授正在开发扫描电化学显微镜(SECM)的新方法，这种方法将使大面积的高分辨率化学成像成为可能。SECM是一种扫描探针显微镜(SPM)技术，已成为跨化学、物理和生物科学研究化学过程的宝贵技术。尽管SECM取得了成功，但它不太适合大范围的高分辨率成像。出现这一限制是因为传统的电化学探针是以顺序的、逐点的方式在感兴趣的区域内扫描的，这意味着在大范围内进行高分辨率成像需要非常长的时间才能完成。目前的项目旨在打破这些权衡，通过结合使用新的传感策略和先进的信号重建方法，实现高效、高分辨率的大样本成像。这种方法将极大地减少成像时间，从而扩大SECM在许多应用中的用途。研究计划与教育和外展活动紧密结合在一起。SECM已成为许多研究领域的宝贵工具。然而，SECM的一个主要缺点是空间分辨率和面扫描速率之间的权衡，这是许多SPM技术所共有的。SECM成像通常以纳米级分辨率进行，但这种高分辨率成像通常限于非常小的区域(通常为平方毫米)。传统SECM的缓慢的面扫描速率是因为扫描点探针或超微电极必须以顺序的、一次一个的方式在感兴趣区域内的每个(X，Y)位置进行扫描。该项目旨在开发一种新的SECM成像方法，它结合了I。非局部连续线探头(CLP)和II。)先进的压缩传感(CS)信号分析技术。虽然CLP的几何结构使SECM信号能够在大范围内快速测量，但CS的关键作用是从CLP产生的卷曲SECM信号构建图像。该项目围绕三个主要目标组织：i.)演示将CLP-SECM与CS，II相结合的核心优势。)确定这一新方法的理论和实践限度，以及三.)在宏观区域实现纳米级分辨率的化学成像。研究和教育紧密结合在这一跨学科研究项目中，重点是针对纳米技术和信号处理/数据分析等新兴行业的教育活动和劳动力培训。

This project is funded by the Chemical Measurement and Imaging program of the Chemistry Division. Professors Daniel Esposito and John Wright of Columbia University are developing new approaches to scanning electrochemical microscopy (SECM) that will enable high resolution chemical imaging over large areas. SECM is a scanning probe microscopy (SPM) technique that has become invaluable for studying chemical processes across the chemical, physical, and biological sciences. Despite the success of SECM, it is not well suited for high resolution imaging over large areas. This limitation arises because conventional electrochemical probes are scanned in a sequential, point-by-point manner across the area of interest, meaning that high resolution imaging over large areas takes prohibitively long times to complete. The current project aims to break these tradeoffs and enable efficient, high-resolution imaging of large samples by using a combination of new sensing strategies and advanced signal reconstruction methodologies. This approach will greatly reduce imaging times and thereby expand the utility of SECM for many applications. The research plans are tightly integrated with educational and outreach activities.SECM has become an invaluable tool in many fields of study. However, a major shortcoming of SECM, shared by many SPM techniques, is the trade-off between spatial resolution and areal scan rates. SECM imaging is commonly performed with nanoscale resolution, but such high resolution imaging is typically limited to very small areas (typically square millimeters). The slow areal scan rates of conventional SECM arise from the fact that the scanning ?point probes?, or ultramicroelectrodes, must be scanned across every (X,Y) location within in an area of interest in a sequential, one-at-a-time manner. This project aims to develop a new approach to SECM imaging that combines i.) non-local continuous line probes (CLPs) and ii.) advanced compressed sensing (CS) signal analysis techniques. While the CLP geometry enables SECM signal to be rapidly measured over large areas, CS serves the critical role of constructing images from the convoluted SECM signal generated by the CLP. The project is organized around three primary objectives: i.) demonstrating the core benefits of combining CLP-SECM with CS, ii.) establishing the theoretical and practical limits of this new approach, and iii.) achieving chemical imaging with nanoscale resolution over macroscopic areas. Research and education are tightly integrated within this interdisciplinary research project, with a strong emphasis on educational activities and workforce training that targets the emerging industries in nanotechnology and signal processing / data analytics.