STTR Phase I: Smart and Fast Atomic Force Microscope for Imaging and Characterization

这个小企业技术转让第一阶段项目代表了原子力显微镜（AFM）技术概念和技术范式的变化，因此将对工业界和学术界的研究和开发产生重大影响。 正如在下面的技术优点中所讨论的，所提出的AFM在成像和探测局部力学方面是快速的、智能的和更强大的。 该公司在AFM控制器的商业化方面有着良好的记录，这些控制器与大多数所有类型的扫描仪兼容，无论是商业扫描仪还是家用扫描仪。 目前的AFM用户可以购买新的扫描仪和/或控制器，以获得增强的性能。此外，新的AFM用户也预计特别是在纳米材料，设备和传感器，以及多维设备和材料，其中高空间和时间分辨率都是至关重要的领域。 此外，结合高空间分辨率与快速将导致在材料开发，表面涂层，纳米材料和纳米器件检测和质量控制，纳米光刻和组织工程领域的直接进步。 根据目前的市场趋势，预计前三年的销售额将达到2500万美元。 考虑到全球显微镜市场的预测增长，这一数字可能会更高。该项目的智力价值包括对当前AFM的三个前沿改进：（1）更快的图像采集速度;（2）自动和快速的特征发现和跟踪;（3）在纳米机械成像的速度和效率方面提高1-2个数量级。 超高速将通过将针对AFM优化的新型可重新配置处理器实施到独特的混合低噪声控制器架构中来实现，该架构具有高度通用性，并且与来自许多不同供应商的AFM显微镜的各种已知配置兼容。 此外，自动特征查找和跟踪功能将直接在硬件中使用人工智能和一种全新的扫描模式来完成，与当前的扫描模式完全不同。追踪回溯扫描轨迹。 这些新的和？聪明吗？这种方法进一步加快了扫描和跟踪速度。 最后，原子力显微镜将能够产生纳米机械图像与高速度和精度使用多频光谱。这个概念已经提出，在过去的五年或更长时间里，通过模拟或实验室原型，已经孤立地证明了各个方面。 更快、更强大的电子控制器将使多频光谱技术的测试和实施充分发挥其潜力。

This Small Business Technology Transfer Phase I project represents a change in concept and technical paradigm for Atomic Force Microscopy (AFM) technology, and as such shall significantly impact research and development in both industry and academia. As discussed in the Technical Merits below, the proposed AFM is fast, smart, and more powerful in terms of imaging and probing local mechanics. The company has a track record of commercializing AFM controllers that are compatible with most all types of scanners, commercial and home-constructed. Current AFM users can purchase the new scanner and/or controller to attain the enhanced performance. In addition, new AFM users are also anticipated especially in the areas of nanomaterials, devices and sensors, and multidimensional devices and materials where both high spatial and temporal resolutions are paramount. Further, the combined high spatial resolution in conjunction with fast speed shall result in immediate advances in the fields of material development, surface coating, nanomaterial and nanodevice inspection and quality control, nanolithography, and tissue engineering. Based on current market trends, sales are anticipated to reach $25M within the first three years. The amount is likely higher given the forecasted growth of the global microscopy market. The intellectual merit of this project includes three cutting edge improvements to current AFM: (1) faster image acquisition speed; (2) automated and rapid feature finding and tracking; (3) 1-2 orders of magnitude of improvement in speed and efficiency in nanomechanical imaging. The ultra-high speed will be achieved by implementing a novel reconfigurable processor optimized for AFM into a unique hybrid, low-noise controller architecture, which is highly versatile and compatible with various known configurations of AFM microscopes from many different vendors. In addition, the automatic feature finding and tracking functions will be accomplished using artificial intelligence directly in hardware and a novel scan pattern, completely different from current ?trace-retrace? scanning trajectory in current AFM. These new and ?smart? approaches further speed up scanning and tracking speed. Finally, the AFM will be able to produce nanomechanical images with high speed and accuracy using multifrequency spectroscopy. This concept has been proposed, and individual aspects have been demonstrated in isolation through simulations or lab prototypes over the past five years or more. The faster and more powerful electronic controller shall enable the test and implementation of multifrequency spectroscopy technology in its full potential.