Analysis and assessment of residual stress components normal to the surface by X-ray diffraction techniques

通过 X 射线衍射技术分析和评估垂直于表面的残余应力分量

• 批准号: 231968279
• 负责人: Professor Dr.-Ing. Berthold Scholtes
• 金额: --
• 依托单位: Fachgebiet Metallische Werkstoffe
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2012
• 资助国家: 德国
• 起止时间: 2011-12-31 至 2015-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/231968279?language=en
• 关键词: Analysis; assessment; residual; stress; components

Due to the small penetration depth of the X-rays used, in case of diffraction residual stress analysis, in most cases a plane surface parallel residual stress state is assumed neglecting possibly existing stress components normal to the surface. This assumption, however, is often questionable and consequences are difficult to assess. In the present project using different types of diffraction residual stress analyses residual stress components normal to the sepecimens surface will be analysed for characteristic materials states and their depth distributions will be described. Investigations will focus on materials states after contact loading, which is very important in industrial practice, e. g. in drive technology or in interactions between workpiece and tools.Correlations between loading conditions, materials microstructures and residual stress components normal to the surface will systematically be studied. Different complementary diffraction techniques for stress analysis will be applied: conventional methods including electrolytical surface layer removal, special techniques to vary the information depths of the X-rays used including synchrotron radiation as well as measurements on specially prepared sections of the deformed materials volumes. Plain carbon steels with different microstructures will be investigated. Residual stress states will be produced by static and oscillating contact loading. In this way under well defined conditions the correlations between materials states, loading conditions and resulting residual stresses normal to the surface will be evaluated.

由于所用X射线的穿透深度很小，在衍射残余应力分析中，大多数情况下假定为平行于表面的平面残余应力状态，忽略了可能存在的垂直于表面的应力分量。然而，这一假设往往是有问题的，其后果难以评估。在本项目中，使用不同类型的衍射残余应力分析，残余应力分量垂直于sepecimens表面将被分析的特征材料状态和它们的深度分布将被描述。研究的重点是材料在接触加载后的状态，这在工业实践中是非常重要的，例如：G.在驱动技术或工件与刀具之间的相互作用中，将系统地研究加载条件、材料微观结构和垂直于表面的残余应力分量之间的相关性。将应用不同的互补衍射技术进行应力分析：传统方法，包括电解表面层去除，特殊技术，以改变所使用的X射线的信息深度，包括同步辐射，以及对变形材料体积的特殊制备部分的测量。将研究具有不同微观结构的普通碳钢。静态和振荡接触载荷将产生残余应力状态。这样，在明确定义的条件下，材料状态、载荷条件和垂直于表面的残余应力之间的相关性将被评估。

项目成果

Analysis of Multiaxial Near-Surface Residual Stress Fields by Energy- and Angle-Dispersive X-ray Diffraction: Semi- Versus Nondestructive Techniques

通过能量色散和角色散 X 射线衍射分析多轴近表面残余应力场：半无损技术与无损技术

• DOI: 10.1520/mpc20170135
• 发表时间: 2018
• 期刊: Materials Performance and Characterization
• 影响因子: 1.1
• 作者: Meixner;Matthias;Manuela;Wolfgang;Daniel;Alexander;Genzel;Christoph;Scholtes;Berthold
• 通讯作者: Berthold